利用遗传算法实现更小的单点故障弹性模拟电路

IF 0.6 4区 工程技术 Q4 ENGINEERING, ELECTRICAL & ELECTRONIC
{"title":"利用遗传算法实现更小的单点故障弹性模拟电路","authors":"","doi":"10.33180/infmidem2023.205","DOIUrl":null,"url":null,"abstract":"Failure-resilient analog circuits are difficult to design, but artificial intelligence can help crawl the topology solution space. Us-ing evolutionary computation-based topology synthesis we evolve analog arcus tangent computational circuits, resilient to any rectifying diode or resistor high-impedance single failure or removal. We encode analog circuit topologies as individuals with an upper-triangular incident matrix. Circuits are evolved using a combined technique utilizing parts of NSGA-II and PSADE, based on a special three-dimensional robustness function. We show that topology size for a failure-resilient circuit can be classes smaller than hand-made component-redundancy-based solutions. Our best failure-resilient topology comprises six diodes, three resistors, and a voltage offset source.","PeriodicalId":56293,"journal":{"name":"Informacije Midem-Journal of Microelectronics Electronic Components and Materials","volume":"8 1","pages":"0"},"PeriodicalIF":0.6000,"publicationDate":"2023-10-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Towards smaller single-point failure-resilient analog circuits by use of a genetic algorithm\",\"authors\":\"\",\"doi\":\"10.33180/infmidem2023.205\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Failure-resilient analog circuits are difficult to design, but artificial intelligence can help crawl the topology solution space. Us-ing evolutionary computation-based topology synthesis we evolve analog arcus tangent computational circuits, resilient to any rectifying diode or resistor high-impedance single failure or removal. We encode analog circuit topologies as individuals with an upper-triangular incident matrix. Circuits are evolved using a combined technique utilizing parts of NSGA-II and PSADE, based on a special three-dimensional robustness function. We show that topology size for a failure-resilient circuit can be classes smaller than hand-made component-redundancy-based solutions. Our best failure-resilient topology comprises six diodes, three resistors, and a voltage offset source.\",\"PeriodicalId\":56293,\"journal\":{\"name\":\"Informacije Midem-Journal of Microelectronics Electronic Components and Materials\",\"volume\":\"8 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.6000,\"publicationDate\":\"2023-10-10\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Informacije Midem-Journal of Microelectronics Electronic Components and Materials\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.33180/infmidem2023.205\",\"RegionNum\":4,\"RegionCategory\":\"工程技术\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q4\",\"JCRName\":\"ENGINEERING, ELECTRICAL & ELECTRONIC\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Informacije Midem-Journal of Microelectronics Electronic Components and Materials","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.33180/infmidem2023.205","RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q4","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
引用次数: 0

摘要

故障弹性模拟电路很难设计,但人工智能可以帮助抓取拓扑解决方案空间。使用基于进化计算的拓扑综合,我们进化出模拟弧切计算电路,对任何整流二极管或电阻高阻抗单故障或移除具有弹性。我们将模拟电路拓扑编码为具有上三角关联矩阵的个体。电路是基于特殊的三维鲁棒性函数,利用NSGA-II和PSADE部分的组合技术进行进化的。我们表明,故障弹性电路的拓扑尺寸可以比手工制作的基于组件冗余的解决方案小一些。我们最好的故障弹性拓扑结构包括六个二极管,三个电阻和一个电压偏移源。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Towards smaller single-point failure-resilient analog circuits by use of a genetic algorithm
Failure-resilient analog circuits are difficult to design, but artificial intelligence can help crawl the topology solution space. Us-ing evolutionary computation-based topology synthesis we evolve analog arcus tangent computational circuits, resilient to any rectifying diode or resistor high-impedance single failure or removal. We encode analog circuit topologies as individuals with an upper-triangular incident matrix. Circuits are evolved using a combined technique utilizing parts of NSGA-II and PSADE, based on a special three-dimensional robustness function. We show that topology size for a failure-resilient circuit can be classes smaller than hand-made component-redundancy-based solutions. Our best failure-resilient topology comprises six diodes, three resistors, and a voltage offset source.
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来源期刊
CiteScore
1.80
自引率
0.00%
发文量
10
审稿时长
>12 weeks
期刊介绍: Informacije MIDEM publishes original research papers in the fields of microelectronics, electronic components and materials. Review papers are published upon invitation only. Scientific novelty and potential interest for a wider spectrum of readers is desired. Authors are encouraged to provide as much detail as possible for others to be able to replicate their results. Therefore, there is no page limit, provided that the text is concise and comprehensive, and any data that does not fit within a classical manuscript can be added as supplementary material. Topics of interest include: Microelectronics, Semiconductor devices, Nanotechnology, Electronic circuits and devices, Electronic sensors and actuators, Microelectromechanical systems (MEMS), Medical electronics, Bioelectronics, Power electronics, Embedded system electronics, System control electronics, Signal processing, Microwave and millimetre-wave techniques, Wireless and optical communications, Antenna technology, Optoelectronics, Photovoltaics, Ceramic materials for electronic devices, Thick and thin film materials for electronic devices.
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