Software defect prediction using a bidirectional LSTM network combined with oversampling techniques

Abstract Software defects are a critical issue in software development that can lead to system failures and cause significant financial losses. Predicting software defects is a vital aspect of ensuring software quality. This can significantly impact both saving time and reducing the overall cost of software testing. During the software defect prediction (SDP) process, automated tools attempt to predict defects in the source codes based on software metrics. Several SDP models have been proposed to identify and prevent defects before they occur. In recent years, recurrent neural network (RNN) techniques have gained attention for their ability to handle sequential data and learn complex patterns. Still, these techniques are not always suitable for predicting software defects due to the problem of imbalanced data. To deal with this problem, this study aims to combine a bidirectional long short-term memory (Bi-LSTM) network with oversampling techniques. To establish the effectiveness and efficiency of the proposed model, the experiments have been conducted on benchmark datasets obtained from the PROMISE repository. The experimental results have been compared and evaluated in terms of accuracy, precision, recall, f-measure, Matthew’s correlation coefficient (MCC), the area under the ROC curve (AUC), the area under the precision-recall curve (AUCPR) and mean square error (MSE). The average accuracy of the proposed model on the original and balanced datasets (using random oversampling and SMOTE) was 88%, 94%, And 92%, respectively. The results showed that the proposed Bi-LSTM on the balanced datasets (using random oversampling and SMOTE) improves the average accuracy by 6 and 4% compared to the original datasets. The average F-measure of the proposed model on the original and balanced datasets (using random oversampling and SMOTE) were 51%, 94%, And 92%, respectively. The results showed that the proposed Bi-LSTM on the balanced datasets (using random oversampling and SMOTE) improves the average F-measure by 43 and 41% compared to the original datasets. The experimental results demonstrated that combining the Bi-LSTM network with oversampling techniques positively affects defect prediction performance in datasets with imbalanced class distributions.