变样本量复合分数缺陷监测过程控制图的设计

DevaArul S, Arunthadhi N
{"title":"变样本量复合分数缺陷监测过程控制图的设计","authors":"DevaArul S, Arunthadhi N","doi":"10.12691/ajams-11-3-1","DOIUrl":null,"url":null,"abstract":"In this article a new control chart to monitor the compound fraction defectives is developed. The variability in the sample sizes and fraction defectives in the process are jointly monitored by using a single chart. The newly developed chart has good advantages over other charts by maintaining a single chart for two variable characteristics. This chart can monitor and control the fraction defectives in a process and at the same time will control the variability in the sample sizes. The ARL values are determined which is compared with other charts. It was found that the ARL of the proposed control chart better performed than the other control charts.","PeriodicalId":91196,"journal":{"name":"American journal of applied mathematics and statistics","volume":"42 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2023-10-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Design of Process Control Charts to Monitor Compound Fraction Defectives with Variable Sample Sizes\",\"authors\":\"DevaArul S, Arunthadhi N\",\"doi\":\"10.12691/ajams-11-3-1\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In this article a new control chart to monitor the compound fraction defectives is developed. The variability in the sample sizes and fraction defectives in the process are jointly monitored by using a single chart. The newly developed chart has good advantages over other charts by maintaining a single chart for two variable characteristics. This chart can monitor and control the fraction defectives in a process and at the same time will control the variability in the sample sizes. The ARL values are determined which is compared with other charts. It was found that the ARL of the proposed control chart better performed than the other control charts.\",\"PeriodicalId\":91196,\"journal\":{\"name\":\"American journal of applied mathematics and statistics\",\"volume\":\"42 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2023-10-11\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"American journal of applied mathematics and statistics\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.12691/ajams-11-3-1\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"American journal of applied mathematics and statistics","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.12691/ajams-11-3-1","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
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Design of Process Control Charts to Monitor Compound Fraction Defectives with Variable Sample Sizes
In this article a new control chart to monitor the compound fraction defectives is developed. The variability in the sample sizes and fraction defectives in the process are jointly monitored by using a single chart. The newly developed chart has good advantages over other charts by maintaining a single chart for two variable characteristics. This chart can monitor and control the fraction defectives in a process and at the same time will control the variability in the sample sizes. The ARL values are determined which is compared with other charts. It was found that the ARL of the proposed control chart better performed than the other control charts.
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