具有瞬时频率依赖性的ADC低复杂度建模、基带互调失真识别与缓解

Q3 Engineering
Stanislas Dubois, Bruno Lelong, Jean-Michel Hodé, Guillaume Ferré, Dominique Dallet
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引用次数: 1

摘要

有源电子元件的线性化,如功率放大器或模数转换器(ADC),是一个广泛的课题。许多问题开始发挥作用,包括行为建模与选择相关模型的准确性,复杂性,识别和补偿。在本文中,我们考虑了一个ADC线性化问题,我们提出了一个原始的低复杂度建模,识别和缓解基带互调失真与瞬时频率相关。因此,我们通过增加对信号瞬时频率变化的依赖来引入幂级数模型的改进。在此基础上,提出了一种适用于双音信号模型标定的方法。最后给出了一个适合于校正模型系数的测量平台,并给出了一些线性化的结果。所提出的所有方法都旨在在嵌入式系统中实时操作,因此研究的计算复杂性非常低。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
ADC low-complexity modelling identification and mitigation of baseband intermodulation distortion with instantaneous frequency dependence
The linearization of active electronic components such as power amplifier or analog-to-digital-converter (ADC), is a vast subject. Many issues come into play, including behavioural modelling with the selection of a relevant model in terms of accuracy, complexity, identification, and compensation. In this paper we consider an ADC linearization problem, we propose an original low-complexity modelling identification and mitigation of baseband intermodulation distortion with instantaneous frequency dependence. Thus, we introduce a refinement of a power series model by adding a dependence on the variation of the instantaneous frequency of the signal. Based on this, we describe a method suitable for the model calibration using a two-tone signal. We finally present a measurement bench adapted to the calibration of the coefficients of the model, followed by some results of linearization. All the methods presented are intended to be operated in real time in embedded systems and are therefore studied to present very low computational complexities.
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来源期刊
Acta IMEKO
Acta IMEKO Engineering-Mechanical Engineering
CiteScore
2.50
自引率
0.00%
发文量
75
期刊介绍: The main goal of this journal is the enhancement of academic activities of IMEKO and a wider dissemination of scientific output from IMEKO TC events. High-quality papers presented at IMEKO conferences, workshops or congresses are seleted by the event organizers and the authors are invited to publish an enhanced version of their paper in this journal. The journal also publishes scientific articles on measurement and instrumentation not related to an IMEKO event.
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