用z扫描技术测定纯SnO2和TiO2掺杂SnO2薄膜的非线性折射率

PD Gupta, Ishtiaque M Syed
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引用次数: 0

摘要

本文采用z扫描技术测定了纯SnO2和TiO2掺杂SnO2薄膜的非线性折射率n2。我们使用入射波长为514 nm的连续波氩离子激光器作为光源。通过改变入射激光强度、纯SnO2薄膜的厚度和SnO2薄膜中TiO2的掺杂浓度三个量来测量n2。从实验结果可以看出,n2值随着SnO2纯膜厚度的增加以及SnO2薄膜中TiO2掺杂浓度的增加而增加。达卡大学学报(自然科学版),71(2):104- 110,2023 (7)
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Determination of Non-linear Refractive Index of Pure SnO2 and TiO2 Doped SnO2 Thin Films Using Z-scan Technique
In this research work the non-linear refractive indices n2 was determined for the pure SnO2 and TiO2 doped SnO2 thin films by using the Z-scan technique. We have used a continuous wave Ar-ion laser with incident wavelength of 514 nm as the source. n2 was measured by varying three quantities: the incident laser intensity, thickness of the pure SnO2 films and doping concentration of TiO2 in SnO2 films. From the experimental results, the values of n2 were found to be increasing with the increase of thickness of the pure SnO2 films and also with the increase of doping concentration of TiO2 in SnO2 thin films. Dhaka Univ. J. Sci. 71(2): 104-110, 2023 (July)
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