纵向沟槽型离子液体电喷雾推进器的发射测量与现场观测

Koki Matsukawa, Yuiko Nakashima, Momoko Naemura, Yoshinori Takao
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引用次数: 0

摘要

摘要为提高离子液体向电喷雾推进器尖端的输运,设计了一种具有纵向沟槽结构的外湿润发射极阵列。利用微机电系统加工技术,成功制备了两种不同槽深的沟槽型发射极。我们评估了电流-电压特性,使用飞行时间(ToF)光谱法测量了质谱,并使用高速显微镜进行了原位观察。离子发射实验结果表明,与没有沟槽的发射体相比,绝对发射电流有所增加。沟槽越深,这种趋势就越明显。此外,即使在高电压下,沟槽结构的电流-电压曲线斜率也没有减小,表明沟槽结构改善了离子液体向发射极尖端的输运。这种改进归功于发射器结构的低液压阻抗。然而,更深的沟槽也增加了提取电极截获电流的百分比,并且在1hz的交替频率下无法避免电化学反应。虽然第一次电流-电压测量具有不稳定的特征,但ToF结果表明,在所有测量条件下,中心线的发射都处于纯离子状态,主要由单体和二聚体离子组成。高速显微镜观察发现,离子液体沉积过多会导致离子从提取器向发射器发射,称为反向喷射,这表明沟槽式发射器结构都没有发射大液滴,这与ToF结果一致。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Emission measurements and in-situ observation of ionic liquid electrospray thrusters with longitudinally grooved emitters
Abstract An externally wetted emitter array with longitudinally grooved structures for ionic liquid electrospray thrusters was fabricated to improve ionic liquid transport to the emitter tips. Two grooved emitter shapes with different groove depths were successfully fabricated using microelectromechanical system processing techniques. We evaluated the current–voltage characteristics, measured the mass spectra using time-of-flight (ToF) spectrometry, and conducted in-situ observations using a high-speed microscope. The experimental results of ion emission show that the absolute emission current increases compared with that of our previous emitter without grooves. This tendency is strengthened with deeper grooves. Moreover, the slope of the current–voltage curve for the grooved emitters does not decrease even when high voltages are applied, indicating that the grooved structure improves the ionic liquid transport to the emitter tips. This improvement is attributed to the low hydraulic impedance of the emitter structure. However, deeper grooving also increases the percentage of current intercepted by the extractor electrode, and electrochemical reactions are not avoided at an alternation frequency of 1 Hz. Although the first current–voltage measurement tended to have unstable characteristics, the ToF results indicated that the emission in the center line was in the pure-ion regime, composed mostly of monomer and dimer ions, under all the measured conditions. High-speed microscope observations showed that too much ionic liquid deposited on the extractor causes ion emission from the extractor to the emitter, known as backspray, and implies that no large droplets are emitted for either grooved emitter structure, which is consistent with the ToF results.
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