一种用于低功率SRAM的具有增强偏移容限的电容耦合堆叠感测放大器

Pub Date : 2023-01-01 DOI:10.1587/elex.20.20230484
Pengyuan Zhao, Huidong Zhao, Jialu Yin, Zhi Li, Shushan Qiao
{"title":"一种用于低功率SRAM的具有增强偏移容限的电容耦合堆叠感测放大器","authors":"Pengyuan Zhao, Huidong Zhao, Jialu Yin, Zhi Li, Shushan Qiao","doi":"10.1587/elex.20.20230484","DOIUrl":null,"url":null,"abstract":"A capacitor-coupled stacked-based sense amplifier (CC-STSA) is proposed to compensate the input-referred offset voltage (VOS), which dictates the minimum required bitline swing for a reliable read operation of static random access memory (SRAM). The data-aware coupled capacitors are employed to dynamically tune the driving ability of sensing transistors according to the data supposed to be read, thus improving the offset tolerance of sense amplifier (SA). Compared with the conventional current latch-type SA (CLSA), the simulation results in 55-nm CMOS technology show that the proposed scheme achieves more than 4.17X of the standard deviation of VOS (σOS) reduction across the range of supply voltage from 0.6V to 1.2V and reduce the read energy consumption and read delay to 54.9% and 45.5% respectively. Furthermore, the proposed scheme reduces the σOS by 2.19X compared to DIBBSA on average.","PeriodicalId":0,"journal":{"name":"","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2023-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"A capacitor-coupled stacked-based sense amplifier with enhanced offset tolerance for low power SRAM\",\"authors\":\"Pengyuan Zhao, Huidong Zhao, Jialu Yin, Zhi Li, Shushan Qiao\",\"doi\":\"10.1587/elex.20.20230484\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A capacitor-coupled stacked-based sense amplifier (CC-STSA) is proposed to compensate the input-referred offset voltage (VOS), which dictates the minimum required bitline swing for a reliable read operation of static random access memory (SRAM). The data-aware coupled capacitors are employed to dynamically tune the driving ability of sensing transistors according to the data supposed to be read, thus improving the offset tolerance of sense amplifier (SA). Compared with the conventional current latch-type SA (CLSA), the simulation results in 55-nm CMOS technology show that the proposed scheme achieves more than 4.17X of the standard deviation of VOS (σOS) reduction across the range of supply voltage from 0.6V to 1.2V and reduce the read energy consumption and read delay to 54.9% and 45.5% respectively. Furthermore, the proposed scheme reduces the σOS by 2.19X compared to DIBBSA on average.\",\"PeriodicalId\":0,\"journal\":{\"name\":\"\",\"volume\":null,\"pages\":null},\"PeriodicalIF\":0.0,\"publicationDate\":\"2023-01-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1587/elex.20.20230484\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1587/elex.20.20230484","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

摘要

提出了一种电容耦合的基于堆叠的感测放大器(CC-STSA)来补偿输入参考偏置电压(VOS), VOS决定了静态随机存储器(SRAM)可靠读取操作所需的最小位线摆幅。采用数据感知耦合电容根据需要读取的数据动态调整传感晶体管的驱动能力,从而提高了传感放大器的偏置容限。与传统的电流锁存型SA (CLSA)相比,在55纳米CMOS技术下的仿真结果表明,该方案在电源电压0.6 ~ 1.2V范围内,将VOS (σOS)的标准差降低了4.17倍以上,读取能耗和读取延迟分别降低到54.9%和45.5%。此外,与DIBBSA相比,该方案平均降低了2.19倍的σOS。
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A capacitor-coupled stacked-based sense amplifier with enhanced offset tolerance for low power SRAM
A capacitor-coupled stacked-based sense amplifier (CC-STSA) is proposed to compensate the input-referred offset voltage (VOS), which dictates the minimum required bitline swing for a reliable read operation of static random access memory (SRAM). The data-aware coupled capacitors are employed to dynamically tune the driving ability of sensing transistors according to the data supposed to be read, thus improving the offset tolerance of sense amplifier (SA). Compared with the conventional current latch-type SA (CLSA), the simulation results in 55-nm CMOS technology show that the proposed scheme achieves more than 4.17X of the standard deviation of VOS (σOS) reduction across the range of supply voltage from 0.6V to 1.2V and reduce the read energy consumption and read delay to 54.9% and 45.5% respectively. Furthermore, the proposed scheme reduces the σOS by 2.19X compared to DIBBSA on average.
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