改进型gan型电流孔径垂直电子晶体管(CAVET)

Q4 Engineering
HADJEM Dalila, Zakarya KOURDI, Imane FOUR, KERAI Salim, KHAOUANI Mohammed
{"title":"改进型gan型电流孔径垂直电子晶体管(CAVET)","authors":"HADJEM Dalila, Zakarya KOURDI, Imane FOUR, KERAI Salim, KHAOUANI Mohammed","doi":"10.29292/jics.v18i2.680","DOIUrl":null,"url":null,"abstract":"The objectives of this research are to improve and optimize a vertically structure HEMT device based on AlGaN/GaN heterojunctions. This novel proposed structure with double gate command would allow for a better dispersion of the electric field, with peaks lower and farther from the surface than a lateral structure. The research focuses on estimating the performance of a GaN-based vertical structure called a \"Current Aperture Vertical Electron Transistor (CAVET)\" that combines a two-dimensional electron gas (2DEG) and a vertical structure with technology, operation, settings, and performance that can be seen in power applications. Performance operating at high frequencies and low power loss consumer, a device that will, therefore, lead function to best in electrical power and higher system efficiency with IDss equal 0.95 A, -6 V for pinch-off, fT/fMax are 110/250 GHz and 14 % for Drain-lag.","PeriodicalId":39974,"journal":{"name":"Journal of Integrated Circuits and Systems","volume":"50 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2023-09-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Improved GaN-based Current Aperture Vertical Electron Transistor (CAVET)\",\"authors\":\"HADJEM Dalila, Zakarya KOURDI, Imane FOUR, KERAI Salim, KHAOUANI Mohammed\",\"doi\":\"10.29292/jics.v18i2.680\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The objectives of this research are to improve and optimize a vertically structure HEMT device based on AlGaN/GaN heterojunctions. This novel proposed structure with double gate command would allow for a better dispersion of the electric field, with peaks lower and farther from the surface than a lateral structure. The research focuses on estimating the performance of a GaN-based vertical structure called a \\\"Current Aperture Vertical Electron Transistor (CAVET)\\\" that combines a two-dimensional electron gas (2DEG) and a vertical structure with technology, operation, settings, and performance that can be seen in power applications. Performance operating at high frequencies and low power loss consumer, a device that will, therefore, lead function to best in electrical power and higher system efficiency with IDss equal 0.95 A, -6 V for pinch-off, fT/fMax are 110/250 GHz and 14 % for Drain-lag.\",\"PeriodicalId\":39974,\"journal\":{\"name\":\"Journal of Integrated Circuits and Systems\",\"volume\":\"50 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2023-09-27\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Journal of Integrated Circuits and Systems\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.29292/jics.v18i2.680\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q4\",\"JCRName\":\"Engineering\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of Integrated Circuits and Systems","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.29292/jics.v18i2.680","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q4","JCRName":"Engineering","Score":null,"Total":0}
引用次数: 0

摘要

本研究的目的是改进和优化基于AlGaN/GaN异质结的垂直结构HEMT器件。这种具有双栅指挥的新结构将允许更好的电场色散,与横向结构相比,其峰值更低,距离表面更远。这项研究的重点是评估一种基于氮化镓的垂直结构的性能,这种结构被称为“电流孔径垂直电子晶体管(CAVET)”,它结合了二维电子气(2DEG)和垂直结构,其技术、操作、设置和性能可以在电源应用中看到。在高频率和低功耗下工作的性能,因此,该器件将带来最佳的电力功能和更高的系统效率,IDss为0.95 a,引脚截断为-6 V, fT/fMax为110/250 GHz,漏极滞后为14%。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Improved GaN-based Current Aperture Vertical Electron Transistor (CAVET)
The objectives of this research are to improve and optimize a vertically structure HEMT device based on AlGaN/GaN heterojunctions. This novel proposed structure with double gate command would allow for a better dispersion of the electric field, with peaks lower and farther from the surface than a lateral structure. The research focuses on estimating the performance of a GaN-based vertical structure called a "Current Aperture Vertical Electron Transistor (CAVET)" that combines a two-dimensional electron gas (2DEG) and a vertical structure with technology, operation, settings, and performance that can be seen in power applications. Performance operating at high frequencies and low power loss consumer, a device that will, therefore, lead function to best in electrical power and higher system efficiency with IDss equal 0.95 A, -6 V for pinch-off, fT/fMax are 110/250 GHz and 14 % for Drain-lag.
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来源期刊
Journal of Integrated Circuits and Systems
Journal of Integrated Circuits and Systems Engineering-Electrical and Electronic Engineering
CiteScore
0.90
自引率
0.00%
发文量
39
期刊介绍: This journal will present state-of-art papers on Integrated Circuits and Systems. It is an effort of both Brazilian Microelectronics Society - SBMicro and Brazilian Computer Society - SBC to create a new scientific journal covering Process and Materials, Device and Characterization, Design, Test and CAD of Integrated Circuits and Systems. The Journal of Integrated Circuits and Systems is published through Special Issues on subjects to be defined by the Editorial Board. Special issues will publish selected papers from both Brazilian Societies annual conferences, SBCCI - Symposium on Integrated Circuits and Systems and SBMicro - Symposium on Microelectronics Technology and Devices.
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