{"title":"使用SystemVerilog构建用于移位寄存器ic验证的测试平台","authors":"Widianto, H.M. Chasrun, Robert Lis","doi":"10.24425/ijet.2022.141281","DOIUrl":null,"url":null,"abstract":"— A testbench is built to verify a functionality of a shift register IC (Integrated Circuit) from stuck-at-faults, stuck-at-1 as well as stuck-at-0. The testbench is supported by components, i.e., generator, interface, driver, monitor, scoreboard, environment, test, and testbench top. The IC consists of sequential logic circuits of D-type flip-flops. The faults may occur at interconnects between the circuits inside the IC. In order to examine the functionality from the faults, both the testbench and the IC are designed using SystemVerilog and simulated using Questasim simulator. Simulation results show the faults may be detected by the testbench. Moreover, the detected faults may be indicated by error statements in transcript results of the simulator .","PeriodicalId":13922,"journal":{"name":"International Journal of Electronics and Telecommunications","volume":null,"pages":null},"PeriodicalIF":0.5000,"publicationDate":"2023-11-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Build Testbenches for Verification in Shift Register ICs using SystemVerilog\",\"authors\":\"Widianto, H.M. Chasrun, Robert Lis\",\"doi\":\"10.24425/ijet.2022.141281\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"— A testbench is built to verify a functionality of a shift register IC (Integrated Circuit) from stuck-at-faults, stuck-at-1 as well as stuck-at-0. The testbench is supported by components, i.e., generator, interface, driver, monitor, scoreboard, environment, test, and testbench top. The IC consists of sequential logic circuits of D-type flip-flops. The faults may occur at interconnects between the circuits inside the IC. In order to examine the functionality from the faults, both the testbench and the IC are designed using SystemVerilog and simulated using Questasim simulator. Simulation results show the faults may be detected by the testbench. Moreover, the detected faults may be indicated by error statements in transcript results of the simulator .\",\"PeriodicalId\":13922,\"journal\":{\"name\":\"International Journal of Electronics and Telecommunications\",\"volume\":null,\"pages\":null},\"PeriodicalIF\":0.5000,\"publicationDate\":\"2023-11-06\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"International Journal of Electronics and Telecommunications\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.24425/ijet.2022.141281\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q4\",\"JCRName\":\"TELECOMMUNICATIONS\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"International Journal of Electronics and Telecommunications","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.24425/ijet.2022.141281","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q4","JCRName":"TELECOMMUNICATIONS","Score":null,"Total":0}
Build Testbenches for Verification in Shift Register ICs using SystemVerilog
— A testbench is built to verify a functionality of a shift register IC (Integrated Circuit) from stuck-at-faults, stuck-at-1 as well as stuck-at-0. The testbench is supported by components, i.e., generator, interface, driver, monitor, scoreboard, environment, test, and testbench top. The IC consists of sequential logic circuits of D-type flip-flops. The faults may occur at interconnects between the circuits inside the IC. In order to examine the functionality from the faults, both the testbench and the IC are designed using SystemVerilog and simulated using Questasim simulator. Simulation results show the faults may be detected by the testbench. Moreover, the detected faults may be indicated by error statements in transcript results of the simulator .