基于门扩散输入的鉴相器和脉宽放大器的快速锁定低参考杂散级联锁相环

IF 1.1 4区 工程技术 Q4 ENGINEERING, ELECTRICAL & ELECTRONIC
Saurabh Kumar, Yatendra Kumar Singh
{"title":"基于门扩散输入的鉴相器和脉宽放大器的快速锁定低参考杂散级联锁相环","authors":"Saurabh Kumar, Yatendra Kumar Singh","doi":"10.1080/00207217.2023.2278437","DOIUrl":null,"url":null,"abstract":"ABSTRACTThis paper presents a newly proposed high-order cascaded phase-locked loop using a type-I phase-locked loop in the second stage. The type-I phase-locked loop includes a gate-diffusion-input-based phase detector and pulse width amplifier that leads to breaking the trade-off between reference spur and locking time. Moreover, a type-I phase-locked loop deploys a pulse width amplifier after a gate-diffusion-input-based phase detector with variable gain to amplify the phase error between the reference clock and the output of the voltage-controlled oscillator. The proposed architecture has been implemented in a 180-nm semiconductor laboratory CMOS technology. The proposed fifth-order cascaded phase-locked loop achieves the reference spur of -77 dBc, while the conventional first-stage charge-pump-based phase-locked loop achieves -59.7 dBc. It measures the 1.2 μs settling time, whereas conventional first stage charge-pump-based phase-locked loop measures 2.4 μs settling time. The cascaded phase-locked loop operates at 2.4 GHz output frequency, and the simulated phase noise at 1 MHz offset frequency is -105.4 dBc/Hz. It consumes 5.8 mW from a 1.8 V power supply.KEYWORDS: Phase-locked loop (PLL)cascaded PLLgate-diffusion input (GDI)Voltage-controlled oscillator (VCO)pulse width amplifier (PWA)DisclaimerAs a service to authors and researchers we are providing this version of an accepted manuscript (AM). Copyediting, typesetting, and review of the resulting proofs will be undertaken on this manuscript before final publication of the Version of Record (VoR). During production and pre-press, errors may be discovered which could affect the content, and all legal disclaimers that apply to the journal relate to these versions also.","PeriodicalId":54961,"journal":{"name":"International Journal of Electronics","volume":"26 1","pages":"0"},"PeriodicalIF":1.1000,"publicationDate":"2023-11-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"A fast-locking low-reference spur cascaded PLL with gate-diffusion input-based phase detector and pulse width amplifier\",\"authors\":\"Saurabh Kumar, Yatendra Kumar Singh\",\"doi\":\"10.1080/00207217.2023.2278437\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"ABSTRACTThis paper presents a newly proposed high-order cascaded phase-locked loop using a type-I phase-locked loop in the second stage. The type-I phase-locked loop includes a gate-diffusion-input-based phase detector and pulse width amplifier that leads to breaking the trade-off between reference spur and locking time. Moreover, a type-I phase-locked loop deploys a pulse width amplifier after a gate-diffusion-input-based phase detector with variable gain to amplify the phase error between the reference clock and the output of the voltage-controlled oscillator. The proposed architecture has been implemented in a 180-nm semiconductor laboratory CMOS technology. The proposed fifth-order cascaded phase-locked loop achieves the reference spur of -77 dBc, while the conventional first-stage charge-pump-based phase-locked loop achieves -59.7 dBc. It measures the 1.2 μs settling time, whereas conventional first stage charge-pump-based phase-locked loop measures 2.4 μs settling time. The cascaded phase-locked loop operates at 2.4 GHz output frequency, and the simulated phase noise at 1 MHz offset frequency is -105.4 dBc/Hz. It consumes 5.8 mW from a 1.8 V power supply.KEYWORDS: Phase-locked loop (PLL)cascaded PLLgate-diffusion input (GDI)Voltage-controlled oscillator (VCO)pulse width amplifier (PWA)DisclaimerAs a service to authors and researchers we are providing this version of an accepted manuscript (AM). Copyediting, typesetting, and review of the resulting proofs will be undertaken on this manuscript before final publication of the Version of Record (VoR). During production and pre-press, errors may be discovered which could affect the content, and all legal disclaimers that apply to the journal relate to these versions also.\",\"PeriodicalId\":54961,\"journal\":{\"name\":\"International Journal of Electronics\",\"volume\":\"26 1\",\"pages\":\"0\"},\"PeriodicalIF\":1.1000,\"publicationDate\":\"2023-11-07\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"International Journal of Electronics\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1080/00207217.2023.2278437\",\"RegionNum\":4,\"RegionCategory\":\"工程技术\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q4\",\"JCRName\":\"ENGINEERING, ELECTRICAL & ELECTRONIC\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"International Journal of Electronics","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1080/00207217.2023.2278437","RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q4","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
引用次数: 0

摘要

摘要本文提出了一种新的高阶级联锁相环,在第二级采用i型锁相环。i型锁相环包括一个基于门扩散输入的鉴相器和脉冲宽度放大器,从而打破了参考杂散和锁相时间之间的权衡。此外,i型锁相环在可变增益的基于门扩散输入的鉴相器后部署了一个脉宽放大器,以放大参考时钟与压控振荡器输出之间的相位误差。所提出的架构已在180纳米半导体实验室CMOS技术中实现。所提出的五阶级联锁相环的参考杂散为-77 dBc,而传统的第一级电荷泵锁相环的参考杂散为-59.7 dBc。该锁相环的稳定时间为1.2 μs,而传统的第一级电荷泵锁相环的稳定时间为2.4 μs。级联锁相环工作在2.4 GHz输出频率,在1mhz偏置频率下模拟的相位噪声为-105.4 dBc/Hz。它从1.8 V的电源消耗5.8 mW。关键词:锁相环(PLL)级联pl栅极扩散输入(GDI)压控振荡器(VCO)脉冲宽度放大器(PWA)免责声明作为对作者和研究人员的服务,我们提供此版本的接受稿件(AM)。在最终出版版本记录(VoR)之前,将对该手稿进行编辑、排版和审查。在制作和印前,可能会发现可能影响内容的错误,所有适用于期刊的法律免责声明也与这些版本有关。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
A fast-locking low-reference spur cascaded PLL with gate-diffusion input-based phase detector and pulse width amplifier
ABSTRACTThis paper presents a newly proposed high-order cascaded phase-locked loop using a type-I phase-locked loop in the second stage. The type-I phase-locked loop includes a gate-diffusion-input-based phase detector and pulse width amplifier that leads to breaking the trade-off between reference spur and locking time. Moreover, a type-I phase-locked loop deploys a pulse width amplifier after a gate-diffusion-input-based phase detector with variable gain to amplify the phase error between the reference clock and the output of the voltage-controlled oscillator. The proposed architecture has been implemented in a 180-nm semiconductor laboratory CMOS technology. The proposed fifth-order cascaded phase-locked loop achieves the reference spur of -77 dBc, while the conventional first-stage charge-pump-based phase-locked loop achieves -59.7 dBc. It measures the 1.2 μs settling time, whereas conventional first stage charge-pump-based phase-locked loop measures 2.4 μs settling time. The cascaded phase-locked loop operates at 2.4 GHz output frequency, and the simulated phase noise at 1 MHz offset frequency is -105.4 dBc/Hz. It consumes 5.8 mW from a 1.8 V power supply.KEYWORDS: Phase-locked loop (PLL)cascaded PLLgate-diffusion input (GDI)Voltage-controlled oscillator (VCO)pulse width amplifier (PWA)DisclaimerAs a service to authors and researchers we are providing this version of an accepted manuscript (AM). Copyediting, typesetting, and review of the resulting proofs will be undertaken on this manuscript before final publication of the Version of Record (VoR). During production and pre-press, errors may be discovered which could affect the content, and all legal disclaimers that apply to the journal relate to these versions also.
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来源期刊
International Journal of Electronics
International Journal of Electronics 工程技术-工程:电子与电气
CiteScore
3.30
自引率
15.40%
发文量
110
审稿时长
8 months
期刊介绍: The International Journal of Electronics (IJE) supports technical applications and developing research at the cutting edge of electronics. Encompassing a broad range of electronic topics, we are a leading electronics journal dedicated to quickly sharing new concepts and developments the field of electronics.
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