乳房钙化x射线成像中半导体材料的CNR性能

IF 1.3 4区 工程技术 Q3 INSTRUMENTS & INSTRUMENTATION
L. Mendoza, C. Avila, R. Rodríguez, L. Loaiza, G. Roque
{"title":"乳房钙化x射线成像中半导体材料的CNR性能","authors":"L. Mendoza, C. Avila, R. Rodríguez, L. Loaiza, G. Roque","doi":"10.1088/1748-0221/18/11/t11001","DOIUrl":null,"url":null,"abstract":"Abstract We present the results of a GAMOS/GEANT4 computer simulation of a standard X-ray mammography system, which consists of a Tungsten 28 kVp polychromatic X-ray source with a 50 μm Rh filter, a mammography phantom with Al 2 O 3 spherical specks of different diameters, and a generic pixel detector (55 μm × 55 μm pixel size) with different types of semiconductor sensors. The number of photons simulated is calibrated to produce similar entrance surface dose (ESD) as the one used by a standard clinical mammography screening. Estimates of Contrast to Noise Ratio (CNR) as a function of ESD, sensor thickness and microcalcification diameter are presented for four different sensor materials: Silicon (Si), Cadmium Telluride (CdTe), Gallium Arsenide (GaAs) and Perovskite (MAPbI3). For the X-ray energy spectrum and pixel size considered, and an ESD dose of 4 mGy, our study shows that, with the exception of Si, these sensors, as thin as 200 μm, are able to resolve (with at least 3 standard deviations above background) Al 2 O 3 spherical specks up to a minimum diameter of 180 μm, having statistically compatible CNR performance. The increase in substrate thickness has a substantial improvement in the CNR values provided by the Si sensor, while for the other cases the enhancement of CNR is marginal and consistent with statistical uncertainties with the thinnest case considered.","PeriodicalId":16184,"journal":{"name":"Journal of Instrumentation","volume":"34 4","pages":"0"},"PeriodicalIF":1.3000,"publicationDate":"2023-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"CNR performance of semiconductor materials for X-ray imaging of breast calcifications\",\"authors\":\"L. Mendoza, C. Avila, R. Rodríguez, L. Loaiza, G. Roque\",\"doi\":\"10.1088/1748-0221/18/11/t11001\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Abstract We present the results of a GAMOS/GEANT4 computer simulation of a standard X-ray mammography system, which consists of a Tungsten 28 kVp polychromatic X-ray source with a 50 μm Rh filter, a mammography phantom with Al 2 O 3 spherical specks of different diameters, and a generic pixel detector (55 μm × 55 μm pixel size) with different types of semiconductor sensors. The number of photons simulated is calibrated to produce similar entrance surface dose (ESD) as the one used by a standard clinical mammography screening. Estimates of Contrast to Noise Ratio (CNR) as a function of ESD, sensor thickness and microcalcification diameter are presented for four different sensor materials: Silicon (Si), Cadmium Telluride (CdTe), Gallium Arsenide (GaAs) and Perovskite (MAPbI3). For the X-ray energy spectrum and pixel size considered, and an ESD dose of 4 mGy, our study shows that, with the exception of Si, these sensors, as thin as 200 μm, are able to resolve (with at least 3 standard deviations above background) Al 2 O 3 spherical specks up to a minimum diameter of 180 μm, having statistically compatible CNR performance. The increase in substrate thickness has a substantial improvement in the CNR values provided by the Si sensor, while for the other cases the enhancement of CNR is marginal and consistent with statistical uncertainties with the thinnest case considered.\",\"PeriodicalId\":16184,\"journal\":{\"name\":\"Journal of Instrumentation\",\"volume\":\"34 4\",\"pages\":\"0\"},\"PeriodicalIF\":1.3000,\"publicationDate\":\"2023-11-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Journal of Instrumentation\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1088/1748-0221/18/11/t11001\",\"RegionNum\":4,\"RegionCategory\":\"工程技术\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q3\",\"JCRName\":\"INSTRUMENTS & INSTRUMENTATION\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of Instrumentation","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1088/1748-0221/18/11/t11001","RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"INSTRUMENTS & INSTRUMENTATION","Score":null,"Total":0}
引用次数: 0

摘要

摘要采用GAMOS/GEANT4计算机模拟了一个标准的x射线乳房造影系统,该系统由一个带有50 μm Rh滤波器的钨28 kVp多色x射线源、一个带有不同直径的Al 2o3球形点的乳房造影模体和一个带有不同类型半导体传感器的通用像素检测器(55 μm × 55 μm像素大小)组成。模拟光子的数量被校准,以产生与标准临床乳房x线摄影筛查使用的相似的入口表面剂量(ESD)。对四种不同的传感器材料:硅(Si)、碲化镉(CdTe)、砷化镓(GaAs)和钙钛矿(MAPbI3),给出了对比度噪声比(CNR)作为ESD、传感器厚度和微钙化直径的函数的估计。考虑到x射线能谱和像素尺寸,以及4 mGy的ESD剂量,我们的研究表明,除Si外,这些厚度为200 μm的传感器能够分辨(在背景以上至少3个标准差)最小直径为180 μm的Al 2o3球形斑点,具有统计上兼容的CNR性能。衬底厚度的增加对Si传感器提供的CNR值有实质性的改善,而对于其他情况,CNR的增强是边际的,并且与考虑最薄情况的统计不确定性一致。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
CNR performance of semiconductor materials for X-ray imaging of breast calcifications
Abstract We present the results of a GAMOS/GEANT4 computer simulation of a standard X-ray mammography system, which consists of a Tungsten 28 kVp polychromatic X-ray source with a 50 μm Rh filter, a mammography phantom with Al 2 O 3 spherical specks of different diameters, and a generic pixel detector (55 μm × 55 μm pixel size) with different types of semiconductor sensors. The number of photons simulated is calibrated to produce similar entrance surface dose (ESD) as the one used by a standard clinical mammography screening. Estimates of Contrast to Noise Ratio (CNR) as a function of ESD, sensor thickness and microcalcification diameter are presented for four different sensor materials: Silicon (Si), Cadmium Telluride (CdTe), Gallium Arsenide (GaAs) and Perovskite (MAPbI3). For the X-ray energy spectrum and pixel size considered, and an ESD dose of 4 mGy, our study shows that, with the exception of Si, these sensors, as thin as 200 μm, are able to resolve (with at least 3 standard deviations above background) Al 2 O 3 spherical specks up to a minimum diameter of 180 μm, having statistically compatible CNR performance. The increase in substrate thickness has a substantial improvement in the CNR values provided by the Si sensor, while for the other cases the enhancement of CNR is marginal and consistent with statistical uncertainties with the thinnest case considered.
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来源期刊
Journal of Instrumentation
Journal of Instrumentation 工程技术-仪器仪表
CiteScore
2.40
自引率
15.40%
发文量
827
审稿时长
7.5 months
期刊介绍: Journal of Instrumentation (JINST) covers major areas related to concepts and instrumentation in detector physics, accelerator science and associated experimental methods and techniques, theory, modelling and simulations. The main subject areas include. -Accelerators: concepts, modelling, simulations and sources- Instrumentation and hardware for accelerators: particles, synchrotron radiation, neutrons- Detector physics: concepts, processes, methods, modelling and simulations- Detectors, apparatus and methods for particle, astroparticle, nuclear, atomic, and molecular physics- Instrumentation and methods for plasma research- Methods and apparatus for astronomy and astrophysics- Detectors, methods and apparatus for biomedical applications, life sciences and material research- Instrumentation and techniques for medical imaging, diagnostics and therapy- Instrumentation and techniques for dosimetry, monitoring and radiation damage- Detectors, instrumentation and methods for non-destructive tests (NDT)- Detector readout concepts, electronics and data acquisition methods- Algorithms, software and data reduction methods- Materials and associated technologies, etc.- Engineering and technical issues. JINST also includes a section dedicated to technical reports and instrumentation theses.
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