辐射场中NaI (TI)闪烁体探测器响应的全过程模拟

Q4 Physics and Astronomy

光学应用 Pub Date : 2023-01-01 DOI:10.5768/jao202344.0501004

YU Saiyun, QIU Huaili, LI Jia, ZHU Tao, SONG Fengquan

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引用次数: 0

摘要

NaI(TI)探测器是典型的闪烁体辐射探测器，其探测过程涉及辐射能量沉积、可见光信号产生与输运、光电转换与信号处理等物理过程。首先利用蒙特卡罗方法、Birks公式及射线追迹程序，开展了射线粒子在晶体中转为可见光输出过程的计算分析，并结合光电倍增管和信号处理电路的指标参数进行模拟仿真，得出探测器最终输出的脉冲电压信号参数；然后，在137Cs源辐射场中采用Φ50 mm×50 mm NaI(TI)晶体耦合光电倍增管开展实验验证，实验测得探测器输出脉冲信号的上升/下降时间比为0.39，与模拟计算数值0.36相比，相差约7.69%，表明模拟计算模型的输出结果与实测数据基本符合，初步证明了论文的模拟计算模型及计算分析过程的正确性。论文提出的方法，对于深入理解辐射粒子激发的荧光可见光在晶体闪烁体中的传输规律和闪烁体辐射探测器系统的优化设计，具有一定参考意义。

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Whole-process simulation of NaI (TI) scintillator detector response in radiation field

NaI(TI)探测器是典型的闪烁体辐射探测器，其探测过程涉及辐射能量沉积、可见光信号产生与输运、光电转换与信号处理等物理过程。首先利用蒙特卡罗方法、Birks公式及射线追迹程序，开展了射线粒子在晶体中转为可见光输出过程的计算分析，并结合光电倍增管和信号处理电路的指标参数进行模拟仿真，得出探测器最终输出的脉冲电压信号参数；然后，在¹³⁷Cs源辐射场中采用Φ50 mm×50 mm NaI(TI)晶体耦合光电倍增管开展实验验证，实验测得探测器输出脉冲信号的上升/下降时间比为0.39，与模拟计算数值0.36相比，相差约7.69%，表明模拟计算模型的输出结果与实测数据基本符合，初步证明了论文的模拟计算模型及计算分析过程的正确性。论文提出的方法，对于深入理解辐射粒子激发的荧光可见光在晶体闪烁体中的传输规律和闪烁体辐射探测器系统的优化设计，具有一定参考意义。

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来源期刊

光学应用 Physics and Astronomy-Atomic and Molecular Physics, and Optics

CiteScore

1.00

自引率

0.00%

发文量

5894

期刊介绍： Journal of Applied Optics was founded in 1980, and its domestic and international publication numbers are ISSN 1002-2082 and CN-61-1171/O4. The journal is a technical journal sponsored by the China Ordnance Society and the 205th Institute of China Ordnance Industry. It was included in the "China Science and Technology Core Journal" in April 2006 and in the "Chinese Core Journal" in December 2008. It is included in the journals of important international retrieval institutions such as the American Chemical Abstracts (CA), Cambridge Scientific Abstracts (CSA), Russian Abstracts Journal (AJ), British Scientific Abstracts (INSPEC), Ulrich's Periodical Directory (UIPD), and Polish Index Copernicus (IC). The purpose of the journal is to track the research trends of high-tech at home and abroad, and comprehensively reflect the development status, research level, and application of optoelectronic technology at home and abroad; focus on optoelectronic application technology, advocate scientific research, be close to readers, and be close to enterprises, and focus on reporting new theories, new technologies and new methods, new products, and development trends in the field of optoelectronic technology at home and abroad. This journal solicits research papers on engineering optics, optical information acquisition and processing, optical metrology and detection, low-light-level night vision technology, fiber optic sensing technology, infrared application technology, laser application technology, optoelectronic devices, thin film optics, optical processes and equipment, and displays.