用于碳纤维增强聚合物检测的高灵敏度相位成像涡流磁光学系统

Q1 Engineering
Jiang-Shan Ai , Quan Zhou , Yi-Ping Liang , Chun-Rui Feng , Bing Long , Li-Bing Bai , Yong-Gang Wang , Chao Ren
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引用次数: 0

摘要

本文提出了一种用于碳纤维增强聚合物(CFRP)缺陷检测的高灵敏度相位成像涡流磁光(PI-ECMO)系统。与其他基于涡流的检测系统相比,该系统采用了一个固定位置的激励线圈,同时使检测点可在检测区域内移动。这种配置有效地减轻了升力效应造成的干扰,而升力效应在使用移动励磁线圈的系统中很常见。相应地,理论分析和数值模拟详细研究了缺陷特征(方向和位置)与表面垂直磁场分布(振幅和相位)之间的关系。在 CFRP 编织板上进行的实验表明,所设计的 PI-ECMO 系统能够有效检测表面和内部裂纹以及冲击缺陷。与传统的涡流磁光 (ECMO) 系统相比,激发电流大大降低。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
High-sensitivity phase imaging eddy current magneto-optical system for carbon fiber reinforced polymers detection

This paper proposed a high-sensitivity phase imaging eddy current magneto-optical (PI-ECMO) system for carbon fiber reinforced polymer (CFRP) defect detection. In contrast to other eddy current-based detection systems, the proposed system employs a fixed position excitation coil while enabling the detection point to move within the detection region. This configuration effectively mitigates the interference caused by the lift-off effect, which is commonly observed in systems with moving excitation coils. Correspondingly, the relationship between the defect characteristics (orientation and position) and the surface vertical magnetic field distribution (amplitude and phase) is studied in detail by theoretical analysis and numerical simulations. Experiments conducted on woven CFRP plates demonstrate that the designed PI-ECMO system is capable of effectively detecting both surface and internal cracks, as well as impact defects. The excitation current is significantly reduced compared with traditional eddy current magneto-optical (ECMO) systems.

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来源期刊
Journal of Electronic Science and Technology
Journal of Electronic Science and Technology Engineering-Electrical and Electronic Engineering
CiteScore
4.30
自引率
0.00%
发文量
1362
审稿时长
99 days
期刊介绍: JEST (International) covers the state-of-the-art achievements in electronic science and technology, including the most highlight areas: ¨ Communication Technology ¨ Computer Science and Information Technology ¨ Information and Network Security ¨ Bioelectronics and Biomedicine ¨ Neural Networks and Intelligent Systems ¨ Electronic Systems and Array Processing ¨ Optoelectronic and Photonic Technologies ¨ Electronic Materials and Devices ¨ Sensing and Measurement ¨ Signal Processing and Image Processing JEST (International) is dedicated to building an open, high-level academic journal supported by researchers, professionals, and academicians. The Journal has been fully indexed by Ei INSPEC and has published, with great honor, the contributions from more than 20 countries and regions in the world.
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