{"title":"温度对BCZT陶瓷疲劳性能的影响及同步x射线吸收光谱缺陷分析","authors":"Dhanunjaya Munthala, Thita Sonklin, Natthawadi Buatip, Parichat Pomyai, Pattanaphong Janphuang, Soodkhet Pojprapai","doi":"10.1080/10584587.2023.2234587","DOIUrl":null,"url":null,"abstract":"AbstractThis paper presents the effect of temperature on the electrical fatigue behavior of barium calcium zirconate titanate (Ba0.85Ca0.15Zr0.1Ti0.9O3) ceramics. Fatigue degradation and its practical applications are a significant problem in piezo/ferroelectric ceramics. Fatigue-induced domain orientations, physical damage or microcracking, and defects were studied using, X-ray diffraction (XRD), synchrotron X-ray absorption spectroscopy (XAS), and scanning electron microscope (SEM) techniques. The remnant polarization (Pr) decreased with the number of fatigue cycles, and the rate at which the decrease occurred was different for different fatigue temperatures. The weak and strong domain wall pinning effects played a major role in the Pr value with respect to the fatigue cycles. The sharp rise of Ec value at 5 × 103 cycles and the abrupt decrease of Ec values after 5 × 104 cycles could be due to the field screening effect and heat recovery of pinned domains. The abrupt decrease of Pr values after 5 × 105 cycles could be due to physical damage near the electrode interface region, and the same physical damage decreased with the increase in fatigue temperature. The near-edge X-ray absorption fine structure (NEXAFS) study was utilized to evaluate the oxygen-related defect concentration.Keywords: Lead-free ceramicstemperature-dependent fatigueoxygen defectsdepolarization of domainsNEXAFS AcknowledgmentsDr. Julia Glaum, Department of Materials Science and Engineering, Norwegian University of Science and Technology, Norway, is acknowledged for her useful discussion. Dr. Siriporn Tigunta and Mr. Mongkol Kongtungmon, School of Ceramic Engineering, Suranaree University of Technology, are acknowledged for their technical support.Disclosure StatementNo potential conflict of interest was reported by the author(s).Additional informationFundingThis work is supported by the SUT Research and Development Fund.","PeriodicalId":13686,"journal":{"name":"Integrated Ferroelectrics","volume":"63 1","pages":"0"},"PeriodicalIF":0.7000,"publicationDate":"2023-09-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Temperature Effect on Fatigue Behavior of BCZT Ceramics and Defects Analysis by Synchrotron X-Ray Absorption Spectroscopy\",\"authors\":\"Dhanunjaya Munthala, Thita Sonklin, Natthawadi Buatip, Parichat Pomyai, Pattanaphong Janphuang, Soodkhet Pojprapai\",\"doi\":\"10.1080/10584587.2023.2234587\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"AbstractThis paper presents the effect of temperature on the electrical fatigue behavior of barium calcium zirconate titanate (Ba0.85Ca0.15Zr0.1Ti0.9O3) ceramics. Fatigue degradation and its practical applications are a significant problem in piezo/ferroelectric ceramics. Fatigue-induced domain orientations, physical damage or microcracking, and defects were studied using, X-ray diffraction (XRD), synchrotron X-ray absorption spectroscopy (XAS), and scanning electron microscope (SEM) techniques. The remnant polarization (Pr) decreased with the number of fatigue cycles, and the rate at which the decrease occurred was different for different fatigue temperatures. The weak and strong domain wall pinning effects played a major role in the Pr value with respect to the fatigue cycles. The sharp rise of Ec value at 5 × 103 cycles and the abrupt decrease of Ec values after 5 × 104 cycles could be due to the field screening effect and heat recovery of pinned domains. The abrupt decrease of Pr values after 5 × 105 cycles could be due to physical damage near the electrode interface region, and the same physical damage decreased with the increase in fatigue temperature. The near-edge X-ray absorption fine structure (NEXAFS) study was utilized to evaluate the oxygen-related defect concentration.Keywords: Lead-free ceramicstemperature-dependent fatigueoxygen defectsdepolarization of domainsNEXAFS AcknowledgmentsDr. Julia Glaum, Department of Materials Science and Engineering, Norwegian University of Science and Technology, Norway, is acknowledged for her useful discussion. Dr. Siriporn Tigunta and Mr. Mongkol Kongtungmon, School of Ceramic Engineering, Suranaree University of Technology, are acknowledged for their technical support.Disclosure StatementNo potential conflict of interest was reported by the author(s).Additional informationFundingThis work is supported by the SUT Research and Development Fund.\",\"PeriodicalId\":13686,\"journal\":{\"name\":\"Integrated Ferroelectrics\",\"volume\":\"63 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.7000,\"publicationDate\":\"2023-09-29\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Integrated Ferroelectrics\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1080/10584587.2023.2234587\",\"RegionNum\":4,\"RegionCategory\":\"工程技术\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q4\",\"JCRName\":\"ENGINEERING, ELECTRICAL & ELECTRONIC\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Integrated Ferroelectrics","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1080/10584587.2023.2234587","RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q4","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
Temperature Effect on Fatigue Behavior of BCZT Ceramics and Defects Analysis by Synchrotron X-Ray Absorption Spectroscopy
AbstractThis paper presents the effect of temperature on the electrical fatigue behavior of barium calcium zirconate titanate (Ba0.85Ca0.15Zr0.1Ti0.9O3) ceramics. Fatigue degradation and its practical applications are a significant problem in piezo/ferroelectric ceramics. Fatigue-induced domain orientations, physical damage or microcracking, and defects were studied using, X-ray diffraction (XRD), synchrotron X-ray absorption spectroscopy (XAS), and scanning electron microscope (SEM) techniques. The remnant polarization (Pr) decreased with the number of fatigue cycles, and the rate at which the decrease occurred was different for different fatigue temperatures. The weak and strong domain wall pinning effects played a major role in the Pr value with respect to the fatigue cycles. The sharp rise of Ec value at 5 × 103 cycles and the abrupt decrease of Ec values after 5 × 104 cycles could be due to the field screening effect and heat recovery of pinned domains. The abrupt decrease of Pr values after 5 × 105 cycles could be due to physical damage near the electrode interface region, and the same physical damage decreased with the increase in fatigue temperature. The near-edge X-ray absorption fine structure (NEXAFS) study was utilized to evaluate the oxygen-related defect concentration.Keywords: Lead-free ceramicstemperature-dependent fatigueoxygen defectsdepolarization of domainsNEXAFS AcknowledgmentsDr. Julia Glaum, Department of Materials Science and Engineering, Norwegian University of Science and Technology, Norway, is acknowledged for her useful discussion. Dr. Siriporn Tigunta and Mr. Mongkol Kongtungmon, School of Ceramic Engineering, Suranaree University of Technology, are acknowledged for their technical support.Disclosure StatementNo potential conflict of interest was reported by the author(s).Additional informationFundingThis work is supported by the SUT Research and Development Fund.
期刊介绍:
Integrated Ferroelectrics provides an international, interdisciplinary forum for electronic engineers and physicists as well as process and systems engineers, ceramicists, and chemists who are involved in research, design, development, manufacturing and utilization of integrated ferroelectric devices. Such devices unite ferroelectric films and semiconductor integrated circuit chips. The result is a new family of electronic devices, which combine the unique nonvolatile memory, pyroelectric, piezoelectric, photorefractive, radiation-hard, acoustic and/or dielectric properties of ferroelectric materials with the dynamic memory, logic and/or amplification properties and miniaturization and low-cost advantages of semiconductor i.c. technology.