基于多数据集的片上系统跌倒检测的k近邻及其分析

Q3 Engineering
Purab Nandi, K. R. Anupama, Himanish Agarwal, Arav Jain, Siddharth Paliwal
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引用次数: 1

摘要

老年人跌倒常常导致严重的伤害和死亡。许多跌倒发生在家庭环境中,因此需要一个可靠的跌倒检测系统,可以以最小的延迟发出警报。基于腕带加速度计的跌倒检测系统和多个数据集是可用的,但没有尝试分析准确性和精度。无论在哪里存在比较,它都是在云上运行的。从未有人尝试过对片上系统(soc)的模型、收敛和数据集分析进行分析。在本文中,我们试图说明为什么机器学习(ML)算法在当前状态下不能在现有的soc上运行。我们使用骁龙410c SoC来进行分析。在本文中,我们使用了第k近邻来证明ML不能直接在soc上运行。我们研究了距离度量和邻居的影响,以及特征提取对精度和延迟的影响。在本文中,我们建立了在soc上使用ML/深度学习算法进行跌落检测的模型压缩和数据修剪的需求。我们通过分析不同架构参数上的各种数据集来做到这一点。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Use of the k-nearest neighbour and its analysis for fall detection on Systems on a Chip for multiple datasets
Fall of an elderly person often leads to serious injuries and death. Many falls occur in the home environment, and hence a reliable fall detection system that can raise alarms with minimum latency is a necessity. Wrist-worn accelerometer-based fall detection systems and multiple datasets are available, but no attempt has been made to analyze the accuracy and precision. Wherever the comparison does exist, it has been run on a cloud. No analysis of the models, convergence, and dataset analysis on Systems on a Chip (SoCs) has ever been attempted. In this paper, we attempt to present why Machine Learning (ML) algorithms in their current state cannot be run on existing SoCs. We have used Snapdragon 410c SoC to do our analytics. In this paper, we have used the kth-nearest neighbour to prove that ML cannot be directly run on SoCs. We have looked at the effect of distance metrics and neighbors as well as the effect of feature extraction on the accuracies and the latencies. In this paper, we establish the need for model compression and data pruning for fall detection using ML/Deep Learning algorithms on SoCs. We have done this by analyzing various datasets on varying architectural parameters.
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来源期刊
Acta IMEKO
Acta IMEKO Engineering-Mechanical Engineering
CiteScore
2.50
自引率
0.00%
发文量
75
期刊介绍: The main goal of this journal is the enhancement of academic activities of IMEKO and a wider dissemination of scientific output from IMEKO TC events. High-quality papers presented at IMEKO conferences, workshops or congresses are seleted by the event organizers and the authors are invited to publish an enhanced version of their paper in this journal. The journal also publishes scientific articles on measurement and instrumentation not related to an IMEKO event.
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