碳化锆薄膜提高铝的耐蚀性

Q4 Physics and Astronomy
{"title":"碳化锆薄膜提高铝的耐蚀性","authors":"","doi":"10.47176/ijpr.23.1.91579","DOIUrl":null,"url":null,"abstract":"In this paper, zirconium carbide (ZrC) thin films were deposited on glass and aluminum substrates using DC magnetron sputtering. It was found that different ratios of acetylene gas (C2H2, as a reactive gas) in the gas mixture of acetylene and argon (Ar, as a sputtering gas) affect the microstructural properties, corrosion behavior, and protection efficiency of ZrC thin films. X-ray diffraction (XRD) was used to characterize the microstructural properties of thin films. The corrosion behavior of thin films in a 3.5% NaCl solution was evaluated by potentiodynamic polarization tests and electrochemical impedance spectroscopy (EIS). FESEM was also employed to examine thin films' surface morphology and thickness.","PeriodicalId":38961,"journal":{"name":"Iranian Journal of Physics Research","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"2023-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Improving corrosion resistance of aluminum by zirconium carbide thin films\",\"authors\":\"\",\"doi\":\"10.47176/ijpr.23.1.91579\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In this paper, zirconium carbide (ZrC) thin films were deposited on glass and aluminum substrates using DC magnetron sputtering. It was found that different ratios of acetylene gas (C2H2, as a reactive gas) in the gas mixture of acetylene and argon (Ar, as a sputtering gas) affect the microstructural properties, corrosion behavior, and protection efficiency of ZrC thin films. X-ray diffraction (XRD) was used to characterize the microstructural properties of thin films. The corrosion behavior of thin films in a 3.5% NaCl solution was evaluated by potentiodynamic polarization tests and electrochemical impedance spectroscopy (EIS). FESEM was also employed to examine thin films' surface morphology and thickness.\",\"PeriodicalId\":38961,\"journal\":{\"name\":\"Iranian Journal of Physics Research\",\"volume\":null,\"pages\":null},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2023-06-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Iranian Journal of Physics Research\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.47176/ijpr.23.1.91579\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q4\",\"JCRName\":\"Physics and Astronomy\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Iranian Journal of Physics Research","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.47176/ijpr.23.1.91579","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q4","JCRName":"Physics and Astronomy","Score":null,"Total":0}
引用次数: 0

摘要

本文采用直流磁控溅射技术在玻璃和铝衬底上制备了碳化锆薄膜。研究发现,在乙炔与氩气(溅射气体为Ar)混合的气体中,不同比例的乙炔气体(反应气体为C2H2)会影响ZrC薄膜的显微组织性能、腐蚀行为和保护效率。采用x射线衍射(XRD)对薄膜的微观结构进行了表征。采用动电位极化试验和电化学阻抗谱(EIS)评价了薄膜在3.5% NaCl溶液中的腐蚀行为。利用FESEM对薄膜的表面形貌和厚度进行了检测。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Improving corrosion resistance of aluminum by zirconium carbide thin films
In this paper, zirconium carbide (ZrC) thin films were deposited on glass and aluminum substrates using DC magnetron sputtering. It was found that different ratios of acetylene gas (C2H2, as a reactive gas) in the gas mixture of acetylene and argon (Ar, as a sputtering gas) affect the microstructural properties, corrosion behavior, and protection efficiency of ZrC thin films. X-ray diffraction (XRD) was used to characterize the microstructural properties of thin films. The corrosion behavior of thin films in a 3.5% NaCl solution was evaluated by potentiodynamic polarization tests and electrochemical impedance spectroscopy (EIS). FESEM was also employed to examine thin films' surface morphology and thickness.
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来源期刊
Iranian Journal of Physics Research
Iranian Journal of Physics Research Physics and Astronomy-Physics and Astronomy (all)
CiteScore
0.20
自引率
0.00%
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0
审稿时长
30 weeks
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