碳化锆薄膜提高铝的耐蚀性

Q4 Physics and Astronomy
{"title":"碳化锆薄膜提高铝的耐蚀性","authors":"","doi":"10.47176/ijpr.23.1.91579","DOIUrl":null,"url":null,"abstract":"In this paper, zirconium carbide (ZrC) thin films were deposited on glass and aluminum substrates using DC magnetron sputtering. It was found that different ratios of acetylene gas (C2H2, as a reactive gas) in the gas mixture of acetylene and argon (Ar, as a sputtering gas) affect the microstructural properties, corrosion behavior, and protection efficiency of ZrC thin films. X-ray diffraction (XRD) was used to characterize the microstructural properties of thin films. The corrosion behavior of thin films in a 3.5% NaCl solution was evaluated by potentiodynamic polarization tests and electrochemical impedance spectroscopy (EIS). FESEM was also employed to examine thin films' surface morphology and thickness.","PeriodicalId":38961,"journal":{"name":"Iranian Journal of Physics Research","volume":"12 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2023-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Improving corrosion resistance of aluminum by zirconium carbide thin films\",\"authors\":\"\",\"doi\":\"10.47176/ijpr.23.1.91579\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In this paper, zirconium carbide (ZrC) thin films were deposited on glass and aluminum substrates using DC magnetron sputtering. It was found that different ratios of acetylene gas (C2H2, as a reactive gas) in the gas mixture of acetylene and argon (Ar, as a sputtering gas) affect the microstructural properties, corrosion behavior, and protection efficiency of ZrC thin films. X-ray diffraction (XRD) was used to characterize the microstructural properties of thin films. The corrosion behavior of thin films in a 3.5% NaCl solution was evaluated by potentiodynamic polarization tests and electrochemical impedance spectroscopy (EIS). FESEM was also employed to examine thin films' surface morphology and thickness.\",\"PeriodicalId\":38961,\"journal\":{\"name\":\"Iranian Journal of Physics Research\",\"volume\":\"12 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2023-06-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Iranian Journal of Physics Research\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.47176/ijpr.23.1.91579\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q4\",\"JCRName\":\"Physics and Astronomy\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Iranian Journal of Physics Research","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.47176/ijpr.23.1.91579","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q4","JCRName":"Physics and Astronomy","Score":null,"Total":0}
引用次数: 0

摘要

本文采用直流磁控溅射技术在玻璃和铝衬底上制备了碳化锆薄膜。研究发现,在乙炔与氩气(溅射气体为Ar)混合的气体中,不同比例的乙炔气体(反应气体为C2H2)会影响ZrC薄膜的显微组织性能、腐蚀行为和保护效率。采用x射线衍射(XRD)对薄膜的微观结构进行了表征。采用动电位极化试验和电化学阻抗谱(EIS)评价了薄膜在3.5% NaCl溶液中的腐蚀行为。利用FESEM对薄膜的表面形貌和厚度进行了检测。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Improving corrosion resistance of aluminum by zirconium carbide thin films
In this paper, zirconium carbide (ZrC) thin films were deposited on glass and aluminum substrates using DC magnetron sputtering. It was found that different ratios of acetylene gas (C2H2, as a reactive gas) in the gas mixture of acetylene and argon (Ar, as a sputtering gas) affect the microstructural properties, corrosion behavior, and protection efficiency of ZrC thin films. X-ray diffraction (XRD) was used to characterize the microstructural properties of thin films. The corrosion behavior of thin films in a 3.5% NaCl solution was evaluated by potentiodynamic polarization tests and electrochemical impedance spectroscopy (EIS). FESEM was also employed to examine thin films' surface morphology and thickness.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
Iranian Journal of Physics Research
Iranian Journal of Physics Research Physics and Astronomy-Physics and Astronomy (all)
CiteScore
0.20
自引率
0.00%
发文量
0
审稿时长
30 weeks
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信