BaTi0.85Sn0.15O3在储能应用中的介电性能和传导机制的增强

Sagar Dutta, Md. Shahjahan Ali, Angkita Mistry Tama, Md. Masud Parvez, Humayra Ferdous, M.A. Hakim, Md. Sarowar Hossain
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引用次数: 0

摘要

为了提高材料的介电性能,采用两步烧结法,采用固相反应技术制备了BaTiO3和BaTi0.85Sn0.15O3。利用室温(RT ~ 300 K)下的x射线衍射(XRD)和拉曼光谱(Raman)研究了样品的结构,并用透射电镜(TEM)和扫描电镜(SEM)分别对样品的晶体组织和晶粒形貌进行了表征。此外,利用第一性原理计算对BaTiO3和BaTi0.85Sn0.15O3的能带结构和态密度(DOS)进行了评价。BaTiO3和BaTi0.85Sn0.15O3的带隙分别为1.80 eV和1.82 eV。DOS计算表明,在锡掺杂的BaTiO3样品中,Ba2+ (A位)和Ti4+ (B位)阳离子与氧八面体的杂化增加,导致阳离子偏离中心位移。在1350℃下烧结的BaTi0.85Sn0.15O3样品具有有序立方相,其介电常数εr′最高,损耗tanδ最小。从电阻率ρ与温度和频率的关系分析了导电机理。总体预测表明,在1350°C退火的BaTi0.85Sn0.15O3是电子工业中储能电容器件的潜在候选材料。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Enhancement of dielectric properties and conduction mechanism in BaTi0.85Sn0.15O3 for energy storage application
To achieve cost effective materials with improved dielectric properties, BaTiO3 and BaTi0.85Sn0.15O3 have been prepared by solid state reaction technique introducing a two step sintering method. The structure of the samples has been investigated by X-Ray diffraction (XRD) and Raman spectra at room temperature (RT ~ 300 K). In addition, crystallographic microstructures and grain morphology have been evaluated by transmission electron microscopy (TEM) and scanning electron microscopy (SEM) respectively. Apart this, the band structure along with density of states (DOS) are evaluated using first principle calculations for BaTiO3 and BaTi0.85Sn0.15O3. The band structure depicts bandgap of 1.80 eV and 1.82 eV for BaTiO3 and BaTi0.85Sn0.15O3 respectively. The DOS calculation displays the increase in hybridization of Ba2+ (A site) and Ti4+ (B site) cations with oxygen octahedra resulting in off-center displacement of cations in Sn doped BaTiO3 sample. A disordered cubic phase is obtained in BaTi0.85Sn0.15O3 sample sintered at 1350 °C resulting in the highest dielectric constant εr′ with a minimum loss tanδ. The conduction mechanism has been analyzed from the temperature and frequency dependence of resistivity ρ. The overall forecasts indicate BaTi0.85Sn0.15O3 annealed at 1350 °C to be a potential candidate for energy storage capacitive devices in the electronic industry.
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