{"title":"异步Fifo与内存一致性验证模糊刺激生成的实证研究","authors":"","doi":"10.33140/jeee.02.03.13","DOIUrl":null,"url":null,"abstract":"Fuzz testing is a widely used methodology for software testing. It collects feedback of each run and uses it for generation of interesting stimuli in the future. This paper discusses the ability and process of fuzz stimuli generator for hardware verification. We chose an asynchronous FIFO and a memory coherency verification using fuzz [1]. Our results substantiate the effectiveness of fuzz testing in the hardware verification process.","PeriodicalId":39047,"journal":{"name":"Journal of Electrical and Electronics Engineering","volume":"42 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2023-09-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"An Empirical Study of Fuzz Stimuli Generation for Asynchronous Fifo And Memory Coherency Verification\",\"authors\":\"\",\"doi\":\"10.33140/jeee.02.03.13\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Fuzz testing is a widely used methodology for software testing. It collects feedback of each run and uses it for generation of interesting stimuli in the future. This paper discusses the ability and process of fuzz stimuli generator for hardware verification. We chose an asynchronous FIFO and a memory coherency verification using fuzz [1]. Our results substantiate the effectiveness of fuzz testing in the hardware verification process.\",\"PeriodicalId\":39047,\"journal\":{\"name\":\"Journal of Electrical and Electronics Engineering\",\"volume\":\"42 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2023-09-14\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Journal of Electrical and Electronics Engineering\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.33140/jeee.02.03.13\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q4\",\"JCRName\":\"Engineering\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of Electrical and Electronics Engineering","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.33140/jeee.02.03.13","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q4","JCRName":"Engineering","Score":null,"Total":0}
An Empirical Study of Fuzz Stimuli Generation for Asynchronous Fifo And Memory Coherency Verification
Fuzz testing is a widely used methodology for software testing. It collects feedback of each run and uses it for generation of interesting stimuli in the future. This paper discusses the ability and process of fuzz stimuli generator for hardware verification. We chose an asynchronous FIFO and a memory coherency verification using fuzz [1]. Our results substantiate the effectiveness of fuzz testing in the hardware verification process.
期刊介绍:
Journal of Electrical and Electronics Engineering is a scientific interdisciplinary, application-oriented publication that offer to the researchers and to the PhD students the possibility to disseminate their novel and original scientific and research contributions in the field of electrical and electronics engineering. The articles are reviewed by professionals and the selection of the papers is based only on the quality of their content and following the next criteria: the papers presents the research results of the authors, the papers / the content of the papers have not been submitted or published elsewhere, the paper must be written in English, as well as the fact that the papers should include in the reference list papers already published in recent years in the Journal of Electrical and Electronics Engineering that present similar research results. The topics and instructions for authors of this journal can be found to the appropiate sections.