一种w波段低损耗、高功率的反向饱和开关

Peigen Zhou, Haoyi Dong, Zhigang Peng, Jixin Chen, Debin Hou, P. Yan, Yu Xiang, W. Hong
{"title":"一种w波段低损耗、高功率的反向饱和开关","authors":"Peigen Zhou, Haoyi Dong, Zhigang Peng, Jixin Chen, Debin Hou, P. Yan, Yu Xiang, W. Hong","doi":"10.1109/RFIT.2018.8524122","DOIUrl":null,"url":null,"abstract":"This paper presents a sigle-pole double-throw (SPDT) switch using a $0.13\\ {\\mu} \\mathbf{m}$ reverse saturated SiGe HBTs. The switch is based on ${\\lambda}/4$ transmission line and the performance of insertion loss and isolation is improved by adding a small area of substrate contacts around the NPN transistors and an isolation-boosting inductance between the collector and emitter, respectively. A measured insertion loss of 1.4-1.6 dB is achieved at 81-98 GHz and < 2.5 dB in the whole W-band frequencies. The measured output port-to-port isolation is > 25 dB at 78-97 GHz and > 20dB in W-band frequencies. The return loss is better than 10 dB at 75-102 GHz. To the best of the authors' knowledge, the proposed switch demonstrates the lowest insertion loss in the silicon-based SPDT switches in W-band frequencies.","PeriodicalId":297122,"journal":{"name":"2018 IEEE International Symposium on Radio-Frequency Integration Technology (RFIT)","volume":"784 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2018-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"A W-Band Low Loss, High Power SPDT Switch Using Reverse Saturated $0.13\\\\ \\\\mu \\\\mathrm{m}$ SiGe HBTs\",\"authors\":\"Peigen Zhou, Haoyi Dong, Zhigang Peng, Jixin Chen, Debin Hou, P. Yan, Yu Xiang, W. Hong\",\"doi\":\"10.1109/RFIT.2018.8524122\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper presents a sigle-pole double-throw (SPDT) switch using a $0.13\\\\ {\\\\mu} \\\\mathbf{m}$ reverse saturated SiGe HBTs. The switch is based on ${\\\\lambda}/4$ transmission line and the performance of insertion loss and isolation is improved by adding a small area of substrate contacts around the NPN transistors and an isolation-boosting inductance between the collector and emitter, respectively. A measured insertion loss of 1.4-1.6 dB is achieved at 81-98 GHz and < 2.5 dB in the whole W-band frequencies. The measured output port-to-port isolation is > 25 dB at 78-97 GHz and > 20dB in W-band frequencies. The return loss is better than 10 dB at 75-102 GHz. To the best of the authors' knowledge, the proposed switch demonstrates the lowest insertion loss in the silicon-based SPDT switches in W-band frequencies.\",\"PeriodicalId\":297122,\"journal\":{\"name\":\"2018 IEEE International Symposium on Radio-Frequency Integration Technology (RFIT)\",\"volume\":\"784 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2018-08-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2018 IEEE International Symposium on Radio-Frequency Integration Technology (RFIT)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/RFIT.2018.8524122\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2018 IEEE International Symposium on Radio-Frequency Integration Technology (RFIT)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/RFIT.2018.8524122","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1

摘要

本文介绍了一种使用$0.13\ {\mu} \mathbf{m}$反向饱和SiGe hbt的单极双掷(SPDT)开关。该开关基于${\lambda}/4$传输线,并通过在NPN晶体管周围增加小面积的衬底触点和在集电极和发射极之间分别增加隔离增强电感来提高插入损耗和隔离性能。在81-98 GHz频段测量到的插入损耗为1.4-1.6 dB,在整个w频段的插入损耗< 2.5 dB。测量的输出端口到端口隔离在78-97 GHz频率为> 25 dB,在w频段频率为> 20dB。在75 ~ 102 GHz频段,回波损耗小于10 dB。据作者所知,所提出的开关在w频段频率下的硅基SPDT开关中具有最低的插入损耗。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
A W-Band Low Loss, High Power SPDT Switch Using Reverse Saturated $0.13\ \mu \mathrm{m}$ SiGe HBTs
This paper presents a sigle-pole double-throw (SPDT) switch using a $0.13\ {\mu} \mathbf{m}$ reverse saturated SiGe HBTs. The switch is based on ${\lambda}/4$ transmission line and the performance of insertion loss and isolation is improved by adding a small area of substrate contacts around the NPN transistors and an isolation-boosting inductance between the collector and emitter, respectively. A measured insertion loss of 1.4-1.6 dB is achieved at 81-98 GHz and < 2.5 dB in the whole W-band frequencies. The measured output port-to-port isolation is > 25 dB at 78-97 GHz and > 20dB in W-band frequencies. The return loss is better than 10 dB at 75-102 GHz. To the best of the authors' knowledge, the proposed switch demonstrates the lowest insertion loss in the silicon-based SPDT switches in W-band frequencies.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信