基于面向对象设计度量的通用软件故障预测模型系统开发方法

{"title":"基于面向对象设计度量的通用软件故障预测模型系统开发方法","authors":"D. Kumari, K. Rajnish","doi":"10.1007/978-981-13-0776-8_48","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":156887,"journal":{"name":"Nanoelectronics, Circuits and Communication Systems","volume":"68 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2018-08-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"A Systematic Approach Towards Development of Universal Software Fault Prediction Model Using Object-Oriented Design Measurement\",\"authors\":\"D. Kumari, K. Rajnish\",\"doi\":\"10.1007/978-981-13-0776-8_48\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"\",\"PeriodicalId\":156887,\"journal\":{\"name\":\"Nanoelectronics, Circuits and Communication Systems\",\"volume\":\"68 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2018-08-02\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Nanoelectronics, Circuits and Communication Systems\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1007/978-981-13-0776-8_48\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Nanoelectronics, Circuits and Communication Systems","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1007/978-981-13-0776-8_48","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}