NixZn1−xFe2O4及NiO、ZnO、Fe2O3和NixZn1−xFe2O4固体材料在微波频率下介电常数的研究

F. Esa, Z. Abbas, F. M. Idris, M. Hashim
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引用次数: 10

摘要

本文详细研究了在1 GHz ~ 10 GHz频率范围内,利用开放式同轴探头技术测定光纤的介电常数。尖晶石铁素体的组成分别为0.1、0.3、0.5、0.7和0.9。样品在900℃下烧结10小时,温度比室温高4℃/min。粉末x射线衍射(XRD)分析显示了颗粒的相纯度和结晶度。利用扫描电子显微镜(SEM)对成型样品的平面表面进行了表面形貌测量,得到了晶粒形貌、边界和孔隙率等信息。所有样品的制表粒度范围为62 nm - 175 nm。采用Agilent介电探针试剂盒85070B测定Ni-Zn铁氧体样品的复介电常数。探针假定样品是非磁性均质材料。介电常数值还提供了对分数组成对体介电常数值的影响的见解。矢量网络分析仪8720B (VNA)通过同轴电缆连接到安捷伦介电探针套件85070B。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Characterization of NixZn1−xFe2O4 and Permittivity of Solid Material of NiO, ZnO, Fe2O3, and NixZn1−xFe2O4 at Microwave Frequency Using Open Ended Coaxial Probe
This paper describes a detailed study on the application of an open ended coaxial probe technique to determine the permittivity of in the frequency range between 1 GHz and 10 GHz. The compositions of the spinel ferrite were 0.1, 0.3, 0.5, 0.7, and 0.9. The samples were prepared by 10-hour sintering at 900°C with 4°C/min increment from room temperature. Particles showed phase purity and crystallinity in powder X-ray diffraction (XRD) analysis. Surface morphology measurement of scanning electron microscopy (SEM) was conducted on the plane surfaces of the molded samples which gave information about grain morphology, boundaries, and porosity. The tabulated grain size for all samples was in the range of 62 nm–175 nm. The complex permittivity of Ni-Zn ferrite samples was determined using the Agilent Dielectric Probe Kit 85070B. The probe assumed the samples were nonmagnetic homogeneous materials. The permittivity values also provide insights into the effect of the fractional composition of on the bulk permittivity values . Vector Network Analyzer 8720B (VNA) was connected via coaxial cable to the Agilent Dielectric Probe Kit 85070B.
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