{"title":"利用内部电磁场波动作为电子设备认证的手段","authors":"E. Nyemkova, Zenoviy Shandra","doi":"10.1109/MEMSTECH.2018.8365707","DOIUrl":null,"url":null,"abstract":"The article is devoted to authentication of electronic devices in information systems. Differences at the micro level of electronic devices lead to a change in noise characteristics. It has been experimentally confirmed that each electronic device is characterized by a specific autocorrelation function form of noise. This allowed forming the authentication template of the electronic device.","PeriodicalId":179131,"journal":{"name":"2018 XIV-th International Conference on Perspective Technologies and Methods in MEMS Design (MEMSTECH)","volume":"25 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2018-04-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Fluctuations of internal electromagnetic fields as the means of electronic device authentication\",\"authors\":\"E. Nyemkova, Zenoviy Shandra\",\"doi\":\"10.1109/MEMSTECH.2018.8365707\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The article is devoted to authentication of electronic devices in information systems. Differences at the micro level of electronic devices lead to a change in noise characteristics. It has been experimentally confirmed that each electronic device is characterized by a specific autocorrelation function form of noise. This allowed forming the authentication template of the electronic device.\",\"PeriodicalId\":179131,\"journal\":{\"name\":\"2018 XIV-th International Conference on Perspective Technologies and Methods in MEMS Design (MEMSTECH)\",\"volume\":\"25 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2018-04-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2018 XIV-th International Conference on Perspective Technologies and Methods in MEMS Design (MEMSTECH)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/MEMSTECH.2018.8365707\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2018 XIV-th International Conference on Perspective Technologies and Methods in MEMS Design (MEMSTECH)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/MEMSTECH.2018.8365707","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Fluctuations of internal electromagnetic fields as the means of electronic device authentication
The article is devoted to authentication of electronic devices in information systems. Differences at the micro level of electronic devices lead to a change in noise characteristics. It has been experimentally confirmed that each electronic device is characterized by a specific autocorrelation function form of noise. This allowed forming the authentication template of the electronic device.