{"title":"基于CFD技术的化学镀液设计分析","authors":"T. Lee, Jong-Kai Lin","doi":"10.1109/TEPM.2000.895061","DOIUrl":null,"url":null,"abstract":"\n The fluid field of the electroless plating bath was analyzed using a Computational Fluid Dynamics Tool. By solving continuity and momentum equations, the pressure and velocity distributions in the plating bath were predicted. The analysis was performed under various design options: flow direction, flowrate, diffuser plate design, and wafer cassette design. It was found that with the reverse flow option; it seems to deliver uniform flow as compared to the forward flow option. Flow pattern was similar among different flowrates and diffuser designs. Low velocity flow always existed at the top portion of the wafer and near the last row of the wafer cassette. With the hypothesis that slower flowrate results in higher plating rate; a qualitative agreement has been observed between the predicted flow pattern and the plated nickel height uniformity.","PeriodicalId":306962,"journal":{"name":"Heat Transfer: Volume 3","volume":"103 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1999-11-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Design Analysis of an Electroless Plating Bath Using CFD Technique\",\"authors\":\"T. Lee, Jong-Kai Lin\",\"doi\":\"10.1109/TEPM.2000.895061\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"\\n The fluid field of the electroless plating bath was analyzed using a Computational Fluid Dynamics Tool. By solving continuity and momentum equations, the pressure and velocity distributions in the plating bath were predicted. The analysis was performed under various design options: flow direction, flowrate, diffuser plate design, and wafer cassette design. It was found that with the reverse flow option; it seems to deliver uniform flow as compared to the forward flow option. Flow pattern was similar among different flowrates and diffuser designs. Low velocity flow always existed at the top portion of the wafer and near the last row of the wafer cassette. With the hypothesis that slower flowrate results in higher plating rate; a qualitative agreement has been observed between the predicted flow pattern and the plated nickel height uniformity.\",\"PeriodicalId\":306962,\"journal\":{\"name\":\"Heat Transfer: Volume 3\",\"volume\":\"103 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1999-11-14\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Heat Transfer: Volume 3\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/TEPM.2000.895061\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Heat Transfer: Volume 3","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/TEPM.2000.895061","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Design Analysis of an Electroless Plating Bath Using CFD Technique
The fluid field of the electroless plating bath was analyzed using a Computational Fluid Dynamics Tool. By solving continuity and momentum equations, the pressure and velocity distributions in the plating bath were predicted. The analysis was performed under various design options: flow direction, flowrate, diffuser plate design, and wafer cassette design. It was found that with the reverse flow option; it seems to deliver uniform flow as compared to the forward flow option. Flow pattern was similar among different flowrates and diffuser designs. Low velocity flow always existed at the top portion of the wafer and near the last row of the wafer cassette. With the hypothesis that slower flowrate results in higher plating rate; a qualitative agreement has been observed between the predicted flow pattern and the plated nickel height uniformity.