{"title":"用于快速技术表征的自动化CAD工具","authors":"O. Elgabry, F. Hussien, A. Mohieldin","doi":"10.1109/ICM.2017.8268853","DOIUrl":null,"url":null,"abstract":"In this paper an automated CAD tool for rapid technology characterization is presented. The proposed methodology fills the gap found in old, as well as, new IC desgin methdologies technology. The tool allows the user doing a rapid characterization for different devices models available in a technology. The tool is based on a pre-defined suite of test-benches in addition to SKILL code and OCEAN script to allow seamless integration of the tool in the design environment. Finally, a design example is presented using 130 nm CMOS technology using the tool; results are shown for MOSFET devices characterization.","PeriodicalId":115975,"journal":{"name":"2017 29th International Conference on Microelectronics (ICM)","volume":"28 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2017-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"An automated CAD tool for rapid technology characterization\",\"authors\":\"O. Elgabry, F. Hussien, A. Mohieldin\",\"doi\":\"10.1109/ICM.2017.8268853\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In this paper an automated CAD tool for rapid technology characterization is presented. The proposed methodology fills the gap found in old, as well as, new IC desgin methdologies technology. The tool allows the user doing a rapid characterization for different devices models available in a technology. The tool is based on a pre-defined suite of test-benches in addition to SKILL code and OCEAN script to allow seamless integration of the tool in the design environment. Finally, a design example is presented using 130 nm CMOS technology using the tool; results are shown for MOSFET devices characterization.\",\"PeriodicalId\":115975,\"journal\":{\"name\":\"2017 29th International Conference on Microelectronics (ICM)\",\"volume\":\"28 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2017-12-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2017 29th International Conference on Microelectronics (ICM)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICM.2017.8268853\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2017 29th International Conference on Microelectronics (ICM)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICM.2017.8268853","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
An automated CAD tool for rapid technology characterization
In this paper an automated CAD tool for rapid technology characterization is presented. The proposed methodology fills the gap found in old, as well as, new IC desgin methdologies technology. The tool allows the user doing a rapid characterization for different devices models available in a technology. The tool is based on a pre-defined suite of test-benches in addition to SKILL code and OCEAN script to allow seamless integration of the tool in the design environment. Finally, a design example is presented using 130 nm CMOS technology using the tool; results are shown for MOSFET devices characterization.
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