ZnO和gan基宽间隙半导体纳米结构中捕获、弛豫和复合的微观动力学:纳米空间分辨和ps时间分辨阴极发光光谱

J. Christen
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引用次数: 0

摘要

阴极发光显微镜结合了高光谱(δ λ < 0.02 nm)、空间(δ x < 45 nm)和时间(δ < 35 ps)分辨率的独特潜力,可以直接获得半导体的纳米级特性。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Microscopic kinetics of capture, relaxation and recombination in ZnO- and GaN-based wide gap semiconductor nano-structures: nm-Spatially- and ps-time-resolved cathodoluminescence spectroscopy
The unique potential of cathodoluminescence microscopy combining high spectral (deltalambda < 0.02 nm), spatial (delta x < 45 nm), and time (deltat < 35 ps) resolution enables direct access to the nano-scale properties of semiconductors.
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