新兴相变存储器的能量和性能驱动电路设计

Dimin Niu, Yibo Chen, Xiangyu Dong, Yuan Xie
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引用次数: 4

摘要

相变随机存取存储器(PRAM)以其高密度、快速存取、非易失性和良好的可扩展性等特点成为新兴的存储技术之一。PRAM电池的物理特性主要取决于材料特性和制造工艺。然而,接入器件和工作电压对PRAM的性能、功耗和寿命有很大的影响。本文研究了PRAM存储阵列的设计约束,提出了访问器件和电路工作电压的优化设计方案。PRAM存储器的重要特性,如功耗、读写稳定性、速度和寿命都被认为是优化的约束条件。实验结果表明,该方法为接入器件和工作电压提供了可靠的设计空间。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Energy and performance driven circuit design for emerging Phase-Change Memory
Phase-Change Random Access Memory (PRAM) has become one of the most promising emerging memory technologies, due to its attractive features such as high density, fast access, non-volatility, and good scalability. The physical characteristics of a PRAM cell mainly depend on the material characteristic and the fabrication process. However, the access device and the operating voltage have significant impact on the PRAM performance, energy dissipation, and lifetime. In this paper, we study the design constraints for PRAM memory array, and propose design optimizations of the access device and the circuit operational voltage. The important features of PRAM memory, such as power consumption, read/write stability, speed, as well as lifetime are all considered as the constrained conditions in the proposed optimizations. Experimental results showed that the proposed methodology can provide a reliable design space for the access device and the operating voltage.
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