为什么测试数字继电器变得如此困难!第1部分

B. Vandiver
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引用次数: 5

摘要

本文确定了在测试我们在设计现代保护系统中通常使用的到目前为止已经被很好地理解的保护元件时的一些发展问题。核心问题是组合保护元件方案逻辑的复杂性,它使这些“可理解的”保护元件能够更安全可靠地工作,但也阻止我们使用传统的测试技术,如“恒定测试电流”或“阶跃变化/状态排序”来验证设置的特性。此外,它还对常用的测试方法(恒流/恒压)进行了比较,重点是Mho和Quad的公共距离元素,以及这些方法现在如何在正确产生继电器对电力系统故障模拟的期望方面存在不足。它确定了这些方法的不足之处,在什么条件下可以和应该使用它们,以及现在应该使用哪些鲜为人知的测试方法来正确测试这些距离特性的各个方面。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Why testing digital relays are becoming so difficult! Part 1
This paper identifies some of the developing issues in testing what has here to fore been well understood protection elements we commonly used in designing modern protection systems. The core issue is the complexity of the combined protection element scheme logic that enables these “understood” protection elements to function more securely and reliably - but also prevent us from using legacy testing techniques like “constant test current” or “step change/state sequencing” to verify the set characteristic. Additionally, it makes a comparison of the commonly used test methods (constant current/constant voltage) focusing on common distance elements of Mho's and Quad's and how these now fall short in properly generating what the relay expects of a power system fault simulation. It identifies why these methods fall short, under what conditions they can and should be used and which lesser known test method should now be used to properly test all aspects of these distance characteristics.
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