{"title":"IBM Blue Gene/L在线故障预测模块原型","authors":"L. Solano-Quinde, Brett M. Bode","doi":"10.1109/EIT.2008.4554349","DOIUrl":null,"url":null,"abstract":"The growing complexity of scientific applications has led to the design and deployment of large-scale parallel systems. The IBM Blue Gene/L can hold in excess of 200 K processors and it has been designed for high performance and reliability. However, failures in this large-scale parallel system are a major concern, since it has been demonstrated that a failure will significantly reduce the performance of the system.","PeriodicalId":215400,"journal":{"name":"2008 IEEE International Conference on Electro/Information Technology","volume":"79 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2008-05-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"5","resultStr":"{\"title\":\"Module Prototype for Online Failure Prediction for the IBM Blue Gene/L\",\"authors\":\"L. Solano-Quinde, Brett M. Bode\",\"doi\":\"10.1109/EIT.2008.4554349\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The growing complexity of scientific applications has led to the design and deployment of large-scale parallel systems. The IBM Blue Gene/L can hold in excess of 200 K processors and it has been designed for high performance and reliability. However, failures in this large-scale parallel system are a major concern, since it has been demonstrated that a failure will significantly reduce the performance of the system.\",\"PeriodicalId\":215400,\"journal\":{\"name\":\"2008 IEEE International Conference on Electro/Information Technology\",\"volume\":\"79 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2008-05-18\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"5\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2008 IEEE International Conference on Electro/Information Technology\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/EIT.2008.4554349\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2008 IEEE International Conference on Electro/Information Technology","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EIT.2008.4554349","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 5
摘要
科学应用的日益复杂导致了大规模并行系统的设计和部署。IBM Blue Gene/L可以容纳超过200k的处理器,其设计具有高性能和可靠性。然而,这种大规模并行系统中的故障是一个主要问题,因为已经证明故障将显著降低系统的性能。
Module Prototype for Online Failure Prediction for the IBM Blue Gene/L
The growing complexity of scientific applications has led to the design and deployment of large-scale parallel systems. The IBM Blue Gene/L can hold in excess of 200 K processors and it has been designed for high performance and reliability. However, failures in this large-scale parallel system are a major concern, since it has been demonstrated that a failure will significantly reduce the performance of the system.