A. Jain, Lalit Kumar Lata, Abhinandan Jain, P. K. Jain
{"title":"SiO2厚度变化对TFT阈值电压和跨电导的影响","authors":"A. Jain, Lalit Kumar Lata, Abhinandan Jain, P. K. Jain","doi":"10.47904/ijskit.11.2.2021.37-39","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":424149,"journal":{"name":"SKIT Research Journal","volume":"95 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2021-01-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Effect of SiO2 Thickness Variation on Threshold Voltage and Trans-Conductance of TFT\",\"authors\":\"A. Jain, Lalit Kumar Lata, Abhinandan Jain, P. K. Jain\",\"doi\":\"10.47904/ijskit.11.2.2021.37-39\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"\",\"PeriodicalId\":424149,\"journal\":{\"name\":\"SKIT Research Journal\",\"volume\":\"95 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2021-01-11\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"SKIT Research Journal\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.47904/ijskit.11.2.2021.37-39\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"SKIT Research Journal","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.47904/ijskit.11.2.2021.37-39","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}