一种适用于MMIC应用的新型可扩展串联MIM电容器模型

Chupeng Yi, Yang Lu, Hengshuang Zhang, Ziyue Zhao, Xiao-hua Ma, Y. Hao
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引用次数: 0

摘要

随着无线通信技术和集成电路技术的发展,集成无源器件在射频集成电路和单片微波集成电路中得到了越来越多的应用。在ipd中,MIM电容是关键的无源元件,广泛应用于直流偏置电路、去耦等领域。因此,电容模型的准确性和实用性是电路设计成功的关键因素之一。然而,由于MIM电容在高频处存在许多寄生效应,其不再具有纯粹的电容特性,因此,在高频电路设计中,能够准确表征元件的简化等效电路模型对于电路的成功设计至关重要。随着硅基GaN器件在毫米波应用中表现出高温和高功率的优点,越来越多的集成电路采用了硅基GaN器件和元件。为此,我们生产了一系列不同尺寸的MIM电容器,并在4H-SiC衬底上制作了气桥。同时,基于MIM电容结构的物理参数等效电路模型,提出了一种新型的简单宽带。在传统等效电路模型的基础上,介绍了表征金属趋肤效应和损耗的相应元件。集总元模型是一种简化的基于物理的模型,具有宽带和高精度,并给出了参数提取。为了验证模型的准确性和通用性,我们比较了一系列不同尺寸的MIM电容器的测量结果和模型仿真结果。结果表明,该模型能较好地拟合工作频率范围内实测值与仿真值之间的s参数。此外,该模型还具有良好的可扩展性。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
A Novel Scalable Series MIM Capacitor Model for MMIC Applications
With the development of the wireless communication and integrated circuits, Integrated passive devices (IPDs) have gained more and more application in radio frequency (RF) integrated circuit and monolithic microwave integrated circuits (MMICs). Among IPDs, MIM capacitor is a key passive component, widely used in DC-bias circuit, decoupling, etc. Therefore, the accuracy and practicability of the capacitance model is one of the key factors for the success of circuits design.However, since the MIM capacitor has many parasitic effects at high frequencies, it no longer exhibits pure capacitor characteristics anymore, thus, in high frequency circuit design, a simplified equivalent circuit model that can accurately characterizes the components is essential for the successful design of the circuit.As SiC-based GaN devices exhibit the advantages of high temperature and high power in millimeter wave applications, more and more integrated circuit use SiC-based GaN devices and components. With regards to this we produced a series of MIM capacitors of different sizes with air-bridges have been fabricated on 4H–SiC substrate. Also, we proposed a novel of simple broadband, based on the physical parameter equivalent circuit model of MIM capacitor structure.Based on the traditional equivalent circuit model, we introduce the corresponding components that characterize the skin effect and loss of the metal. The lumped element model is a simplified physical based model with broadband and high precision, and parameter extraction is given. To verify the accuracy and versatility of the model, we compared the measured and model simulated results of a series of MIM capacitors of different sizes. The results show that the model can accurately fit the S-parameters between measured and simulated in operating frequency range. In addition, the model shows good scalability as well.
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