模数转换器(adc)可靠性的提高

Mandeep Singh, I. Koren
{"title":"模数转换器(adc)可靠性的提高","authors":"Mandeep Singh, I. Koren","doi":"10.1109/DFTVS.2001.966788","DOIUrl":null,"url":null,"abstract":"The reliability of systems used in space, avionic and biomedical applications is highly critical. Such systems consist of an analog front-end to collect data, an ADC to convert the collected data to digital form and a digital unit to process it. The reliability of these systems is affected by the ability of its constituent blocks to tolerate faults. Therefore, it is necessary to increase the reliability of ADCs to ensure a highly reliable critical system. This paper illustrates the steps involved in the reliability enhancement of ADCs by first proposing a methodology for fault sensitivity analysis and then illustrating redesign techniques to improve the reliability of the highly sensitive(to faults) blocks.","PeriodicalId":187031,"journal":{"name":"Proceedings 2001 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems","volume":"157 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2001-10-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"13","resultStr":"{\"title\":\"Reliability enhancement of analog-to-digital converters (ADCs)\",\"authors\":\"Mandeep Singh, I. Koren\",\"doi\":\"10.1109/DFTVS.2001.966788\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The reliability of systems used in space, avionic and biomedical applications is highly critical. Such systems consist of an analog front-end to collect data, an ADC to convert the collected data to digital form and a digital unit to process it. The reliability of these systems is affected by the ability of its constituent blocks to tolerate faults. Therefore, it is necessary to increase the reliability of ADCs to ensure a highly reliable critical system. This paper illustrates the steps involved in the reliability enhancement of ADCs by first proposing a methodology for fault sensitivity analysis and then illustrating redesign techniques to improve the reliability of the highly sensitive(to faults) blocks.\",\"PeriodicalId\":187031,\"journal\":{\"name\":\"Proceedings 2001 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems\",\"volume\":\"157 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2001-10-24\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"13\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings 2001 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/DFTVS.2001.966788\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings 2001 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/DFTVS.2001.966788","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 13

摘要

用于空间、航空电子和生物医学应用的系统的可靠性是非常关键的。这样的系统包括一个用于采集数据的模拟前端、一个用于将采集到的数据转换为数字形式的ADC和一个用于处理数据的数字单元。这些系统的可靠性受到其组成块容错能力的影响。因此,有必要提高adc的可靠性,以确保关键系统的高可靠性。本文首先提出了一种故障灵敏度分析方法,然后阐述了重新设计技术以提高(对故障)高敏感块的可靠性,从而说明了提高adc可靠性所涉及的步骤。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Reliability enhancement of analog-to-digital converters (ADCs)
The reliability of systems used in space, avionic and biomedical applications is highly critical. Such systems consist of an analog front-end to collect data, an ADC to convert the collected data to digital form and a digital unit to process it. The reliability of these systems is affected by the ability of its constituent blocks to tolerate faults. Therefore, it is necessary to increase the reliability of ADCs to ensure a highly reliable critical system. This paper illustrates the steps involved in the reliability enhancement of ADCs by first proposing a methodology for fault sensitivity analysis and then illustrating redesign techniques to improve the reliability of the highly sensitive(to faults) blocks.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信