远场扫描法中扫描角度对模场直径测量的影响

ICSE'98. 1998 IEEE International Conference on Semiconductor Electronics. Proceedings (Cat. No.98EX187) Pub Date : 1998-11-24 DOI:10.1109/SMELEC.1998.781163

S. Thirumeni, P. Poopalan, A. A. Hassan, H. Ahmad

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引用次数: 0

摘要

采用远场扫描技术和Petermann II定义法测量了阶跃折射率单模光纤的模场直径(MFD)。研究了最大扫描角度和角度分辨率值的选择如何影响测量的MFD值。为了获得精确的MFD值，最大扫描角为12/spl°/，分辨率角为0.5/spl°/是必不可少的。

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Effects of scan angles in the far-field scanning method on the measurement of the mode field diameter

The far-field (FF) scanning technique and the Petermann II definition were used to measure the mode field diameter (MFD) of a step-index single-mode fiber (SMF). Studies were conducted to see how the choice of the maximum scan angle and the angle resolution value could affect the value of the measured MFD. A maximum scan angle of 12/spl deg/ and resolution angle of 0.5/spl deg/ is essential in order to obtain an accurate value for the MFD.

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ICSE'98. 1998 IEEE International Conference on Semiconductor Electronics. Proceedings (Cat. No.98EX187)

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