磁控管里克图的自动测量

V. Bilik
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Constructing Rieke diagrams is tedious, time-consuming and equipment-demanding [2], [3], preventing systematic studies of their dependence on operating conditions, such as anode voltage and its ripple, filament current, mounting repeatability, etc. We have devised a procedure, centering around a high-power automatic impedance matching device (autotuner), which enables fully automatic measurement and plotting of the stated dependences. A block diagram of the setup is shown in Fig. 1. The autotuner, when terminated in a match (waterload), can accomplish a task inverse to impedance matching: realizing any desired reflection coefficient GR. The measurement consists of stepping through a grid of n suitably chosen reflection coefficients GR = xR + jyR, covering a desired area of the polar diagram. Each GR is measured accurately by the autotuner, along with the corresponding fg and PL. Thus, raw data for constructing a Rieke diagram are obtained, the data consisting of a collection of n points {GR, fg, PL}i, i = 1…n, with GR, in general, irregularly scattered in the complex plane. A dedicated MATLAB routine then reads the data, sorts them out to create tabulated functions fg = f(xR, yR), PL = f(xR, yR), approximates these by a 2D spline, and uses the splines to plot smoothed isocontours for chosen constant values of fg and PL, completing thus the desired Rieke diagram construction. We will present details of this procedure as well as real-life examples. Fig. 1. Rieke diagram measurement setup. References Meredith, R. J., Engineers' Handbook of Industrial Microwave Heating, London: The IEE, 1998, 250–270. Takahashi, H., I. Namba, K. Akiyama, J. Microwave Power, 1979, 14, 261–267.Yixue, W., Z. Zhaotang, Proc. 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引用次数: 0

摘要

雷基图[1]是一个可视化的磁控管的特点生成的频率的依赖fg和净输出功率负载反射系数GR。GR PL是定义在一个特定的magnetron-to-waveguide耦合结构称为标准或参考发射器(图1)。图是绘制等值线的家庭不断fg和常数PL的GR的极坐标图。雷基图是必不可少的在应用程序的设计没有光电隔离器,比如家用或专业微波炉。构造Rieke图繁琐、耗时且对设备要求高,因此无法系统地研究它们对工作条件的依赖性,如阳极电压及其纹波、灯丝电流、安装可重复性等。我们设计了一个程序,围绕一个大功率自动阻抗匹配装置(自动调谐器),它可以全自动测量和绘制所述依赖关系。该装置的框图如图1所示。当自动调谐器在匹配(水负载)中终止时,可以完成与阻抗匹配相反的任务:实现任何期望的反射系数GR。测量包括步进n个适当选择的反射系数GR = xR + jyR的网格,覆盖极坐标图的期望区域。通过自动调谐器精确测量每个GR,以及相应的fg和PL,从而得到构造Rieke图的原始数据,该数据由n个点({GR, fg, PL}i, i = 1…n)组成的集合,其中GR一般不规则地分散在复平面上。然后,一个专用的MATLAB例程读取数据,对它们进行分类以创建表格函数fg = f(xR, yR), PL = f(xR, yR),通过2D样条近似这些函数,并使用样条绘制fg和PL所选常量的平滑等高线,从而完成所需的Rieke图构建。我们将介绍这个过程的细节以及现实生活中的例子。图1所示。雷克图测量装置。梅雷迪思,R. J.,工业微波加热的工程师手册,伦敦:ieee, 1998, 250-270。高桥,南波,秋山,等。微波功率,1999,14,261-267。李志强,王志强,李志强,李志强,中国生物医学工程学报,1998,27(1):493 - 498。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Automatic Measurement of Magnetron Rieke Diagrams
A Rieke diagram [1] is a magnetron characteristic that visualizes the dependence of the generated frequency fg and the net delivered power PL on the load reflection coefficient GR. GR is defined in a specific magnetron-to-waveguide coupling structure called the standard or reference launcher (Fig. 1). The diagram is plotted as a family of isolines of constant fg and of constant PL in the polar diagram of GR. Rieke diagrams are essential in the design of applications without isolators, such as domestic or professional microwave ovens. Constructing Rieke diagrams is tedious, time-consuming and equipment-demanding [2], [3], preventing systematic studies of their dependence on operating conditions, such as anode voltage and its ripple, filament current, mounting repeatability, etc. We have devised a procedure, centering around a high-power automatic impedance matching device (autotuner), which enables fully automatic measurement and plotting of the stated dependences. A block diagram of the setup is shown in Fig. 1. The autotuner, when terminated in a match (waterload), can accomplish a task inverse to impedance matching: realizing any desired reflection coefficient GR. The measurement consists of stepping through a grid of n suitably chosen reflection coefficients GR = xR + jyR, covering a desired area of the polar diagram. Each GR is measured accurately by the autotuner, along with the corresponding fg and PL. Thus, raw data for constructing a Rieke diagram are obtained, the data consisting of a collection of n points {GR, fg, PL}i, i = 1…n, with GR, in general, irregularly scattered in the complex plane. A dedicated MATLAB routine then reads the data, sorts them out to create tabulated functions fg = f(xR, yR), PL = f(xR, yR), approximates these by a 2D spline, and uses the splines to plot smoothed isocontours for chosen constant values of fg and PL, completing thus the desired Rieke diagram construction. We will present details of this procedure as well as real-life examples. Fig. 1. Rieke diagram measurement setup. References Meredith, R. J., Engineers' Handbook of Industrial Microwave Heating, London: The IEE, 1998, 250–270. Takahashi, H., I. Namba, K. Akiyama, J. Microwave Power, 1979, 14, 261–267.Yixue, W., Z. Zhaotang, Proc. ICMMT'98, 1998, 795–798.
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