异质结构隔离栅场效应管的微波工作

G. Menk, R. Sadler, M. Balzan, A. Geissberger, I. Bahl, H. Lee
{"title":"异质结构隔离栅场效应管的微波工作","authors":"G. Menk, R. Sadler, M. Balzan, A. Geissberger, I. Bahl, H. Lee","doi":"10.1109/CORNEL.1987.721222","DOIUrl":null,"url":null,"abstract":"Heterostructure Isolated-Gate Field-Effect Transistors (HIGFETs) have for the first time been operated at microwave frequencies. These enhancement-mode devices are fabricated by a refractory self-aligned gate process using undoped MBE-grown heterostructures employing an AlGaAs gate isolation layer. A planarization process with Au-based overlay metallization is used to reduce the gate resistance. Microwave S-parameter and noise measurements have been made on the devices from I to 15 GHz. At 10 GHz, noise figure values of 2.0 to 2.2 dB with associated gain of 6.8 to 7.0 dB have been measured for nonoptimized 1 /spl mu/m-gate HIGFETs.","PeriodicalId":247498,"journal":{"name":"IEEE/Cornell Conference on Advanced Concepts in High Speed Semiconductor Devices and Circuits, 1987. Proceedings.","volume":"29 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1987-08-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Microwave Operation Of Heterostructure Isolated-Gate FETs\",\"authors\":\"G. Menk, R. Sadler, M. Balzan, A. Geissberger, I. Bahl, H. Lee\",\"doi\":\"10.1109/CORNEL.1987.721222\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Heterostructure Isolated-Gate Field-Effect Transistors (HIGFETs) have for the first time been operated at microwave frequencies. These enhancement-mode devices are fabricated by a refractory self-aligned gate process using undoped MBE-grown heterostructures employing an AlGaAs gate isolation layer. A planarization process with Au-based overlay metallization is used to reduce the gate resistance. Microwave S-parameter and noise measurements have been made on the devices from I to 15 GHz. At 10 GHz, noise figure values of 2.0 to 2.2 dB with associated gain of 6.8 to 7.0 dB have been measured for nonoptimized 1 /spl mu/m-gate HIGFETs.\",\"PeriodicalId\":247498,\"journal\":{\"name\":\"IEEE/Cornell Conference on Advanced Concepts in High Speed Semiconductor Devices and Circuits, 1987. Proceedings.\",\"volume\":\"29 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1987-08-10\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"IEEE/Cornell Conference on Advanced Concepts in High Speed Semiconductor Devices and Circuits, 1987. Proceedings.\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/CORNEL.1987.721222\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE/Cornell Conference on Advanced Concepts in High Speed Semiconductor Devices and Circuits, 1987. Proceedings.","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CORNEL.1987.721222","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

摘要

异质结构隔离栅场效应晶体管(higfet)首次在微波频率下工作。这些增强模式器件是利用未掺杂的mbe生长异质结构,采用AlGaAs栅极隔离层,通过难熔自排列栅极工艺制成的。采用了一种采用金基覆盖金属化的平面化工艺来降低栅极电阻。在1 ~ 15 GHz范围内对器件进行了微波s参数和噪声测量。在10 GHz时,未优化的1 /spl mu/m栅极higfet的噪声系数值为2.0至2.2 dB,相关增益为6.8至7.0 dB。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Microwave Operation Of Heterostructure Isolated-Gate FETs
Heterostructure Isolated-Gate Field-Effect Transistors (HIGFETs) have for the first time been operated at microwave frequencies. These enhancement-mode devices are fabricated by a refractory self-aligned gate process using undoped MBE-grown heterostructures employing an AlGaAs gate isolation layer. A planarization process with Au-based overlay metallization is used to reduce the gate resistance. Microwave S-parameter and noise measurements have been made on the devices from I to 15 GHz. At 10 GHz, noise figure values of 2.0 to 2.2 dB with associated gain of 6.8 to 7.0 dB have been measured for nonoptimized 1 /spl mu/m-gate HIGFETs.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信