G. Menk, R. Sadler, M. Balzan, A. Geissberger, I. Bahl, H. Lee
{"title":"异质结构隔离栅场效应管的微波工作","authors":"G. Menk, R. Sadler, M. Balzan, A. Geissberger, I. Bahl, H. Lee","doi":"10.1109/CORNEL.1987.721222","DOIUrl":null,"url":null,"abstract":"Heterostructure Isolated-Gate Field-Effect Transistors (HIGFETs) have for the first time been operated at microwave frequencies. These enhancement-mode devices are fabricated by a refractory self-aligned gate process using undoped MBE-grown heterostructures employing an AlGaAs gate isolation layer. A planarization process with Au-based overlay metallization is used to reduce the gate resistance. Microwave S-parameter and noise measurements have been made on the devices from I to 15 GHz. At 10 GHz, noise figure values of 2.0 to 2.2 dB with associated gain of 6.8 to 7.0 dB have been measured for nonoptimized 1 /spl mu/m-gate HIGFETs.","PeriodicalId":247498,"journal":{"name":"IEEE/Cornell Conference on Advanced Concepts in High Speed Semiconductor Devices and Circuits, 1987. Proceedings.","volume":"29 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1987-08-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Microwave Operation Of Heterostructure Isolated-Gate FETs\",\"authors\":\"G. Menk, R. Sadler, M. Balzan, A. Geissberger, I. Bahl, H. Lee\",\"doi\":\"10.1109/CORNEL.1987.721222\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Heterostructure Isolated-Gate Field-Effect Transistors (HIGFETs) have for the first time been operated at microwave frequencies. These enhancement-mode devices are fabricated by a refractory self-aligned gate process using undoped MBE-grown heterostructures employing an AlGaAs gate isolation layer. A planarization process with Au-based overlay metallization is used to reduce the gate resistance. Microwave S-parameter and noise measurements have been made on the devices from I to 15 GHz. At 10 GHz, noise figure values of 2.0 to 2.2 dB with associated gain of 6.8 to 7.0 dB have been measured for nonoptimized 1 /spl mu/m-gate HIGFETs.\",\"PeriodicalId\":247498,\"journal\":{\"name\":\"IEEE/Cornell Conference on Advanced Concepts in High Speed Semiconductor Devices and Circuits, 1987. Proceedings.\",\"volume\":\"29 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1987-08-10\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"IEEE/Cornell Conference on Advanced Concepts in High Speed Semiconductor Devices and Circuits, 1987. Proceedings.\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/CORNEL.1987.721222\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE/Cornell Conference on Advanced Concepts in High Speed Semiconductor Devices and Circuits, 1987. Proceedings.","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CORNEL.1987.721222","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Microwave Operation Of Heterostructure Isolated-Gate FETs
Heterostructure Isolated-Gate Field-Effect Transistors (HIGFETs) have for the first time been operated at microwave frequencies. These enhancement-mode devices are fabricated by a refractory self-aligned gate process using undoped MBE-grown heterostructures employing an AlGaAs gate isolation layer. A planarization process with Au-based overlay metallization is used to reduce the gate resistance. Microwave S-parameter and noise measurements have been made on the devices from I to 15 GHz. At 10 GHz, noise figure values of 2.0 to 2.2 dB with associated gain of 6.8 to 7.0 dB have been measured for nonoptimized 1 /spl mu/m-gate HIGFETs.