不同人工神经网络技术在x射线图像缺陷自动检测中的比较

Amod P. Rale, D. Gharpure, V. Ravindran
{"title":"不同人工神经网络技术在x射线图像缺陷自动检测中的比较","authors":"Amod P. Rale, D. Gharpure, V. Ravindran","doi":"10.1109/ELECTRO.2009.5441138","DOIUrl":null,"url":null,"abstract":"X-ray imaging is extensively used in the NDT. In the conventional method, interpretation of the large number of radiographs for defect detection and evaluation is carried out manually by operator or expert, which makes the system subjective. Also interpretation of large number of images is tedious and may lead to misinterpretation. Automation of Non-Destructive evaluation techniques is gaining greater relevance but automatic analysis of X-Ray images is still a complex problem, as the images are noisy, low contrast with a number of artifacts. ANN's are systems which can be trained to analyze input data based on conditions provided to derive required output. This makes the system automatic reducing the subjective interference in analysis of data. Artificial neural network based systems are thus a feasible solution to this problem of X-Ray NDT. Due to complex nature of input images and noise present, Noise removal becomes a problem in X-Ray images. Preprocessing techniques based on statistical analysis have shown improvement in image noise reduction. Pixels/group of pixels, which deviate from the general structural pattern and grey scale distribution are located. The statistically processed pixel values are used to obtain the features vector from defective as well as from non-defective areas. Software for pre-processing and analyzing NDT images has been developed. Software allows user to train neural networks for defect detection. Once trained satisfactorily, the software scans the new input image and uses the trained ANN for defect detection. The final image with defect regions marked will be displayed. This system can be used to obtain the probable defective areas in a given input image. This paper presents performance of MLP and RBF for detection of defect. The effect of different types of input viz. template and moments on performance of ANN is discussed.","PeriodicalId":149384,"journal":{"name":"2009 International Conference on Emerging Trends in Electronic and Photonic Devices & Systems","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"2009-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"11","resultStr":"{\"title\":\"Comparison of different ANN techniques for automatic defect detection in X-Ray images\",\"authors\":\"Amod P. Rale, D. Gharpure, V. Ravindran\",\"doi\":\"10.1109/ELECTRO.2009.5441138\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"X-ray imaging is extensively used in the NDT. In the conventional method, interpretation of the large number of radiographs for defect detection and evaluation is carried out manually by operator or expert, which makes the system subjective. Also interpretation of large number of images is tedious and may lead to misinterpretation. Automation of Non-Destructive evaluation techniques is gaining greater relevance but automatic analysis of X-Ray images is still a complex problem, as the images are noisy, low contrast with a number of artifacts. ANN's are systems which can be trained to analyze input data based on conditions provided to derive required output. This makes the system automatic reducing the subjective interference in analysis of data. Artificial neural network based systems are thus a feasible solution to this problem of X-Ray NDT. Due to complex nature of input images and noise present, Noise removal becomes a problem in X-Ray images. Preprocessing techniques based on statistical analysis have shown improvement in image noise reduction. Pixels/group of pixels, which deviate from the general structural pattern and grey scale distribution are located. The statistically processed pixel values are used to obtain the features vector from defective as well as from non-defective areas. Software for pre-processing and analyzing NDT images has been developed. Software allows user to train neural networks for defect detection. Once trained satisfactorily, the software scans the new input image and uses the trained ANN for defect detection. The final image with defect regions marked will be displayed. This system can be used to obtain the probable defective areas in a given input image. This paper presents performance of MLP and RBF for detection of defect. The effect of different types of input viz. template and moments on performance of ANN is discussed.\",\"PeriodicalId\":149384,\"journal\":{\"name\":\"2009 International Conference on Emerging Trends in Electronic and Photonic Devices & Systems\",\"volume\":null,\"pages\":null},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2009-12-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"11\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2009 International Conference on Emerging Trends in Electronic and Photonic Devices & Systems\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ELECTRO.2009.5441138\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2009 International Conference on Emerging Trends in Electronic and Photonic Devices & Systems","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ELECTRO.2009.5441138","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 11

摘要

x射线成像在无损检测中应用广泛。在传统的方法中,对大量的射线照片进行解释以进行缺陷检测和评估是由操作员或专家手动进行的,这使得系统具有主观性。此外,大量图像的解释是繁琐的,并可能导致误解。无损评估技术的自动化越来越重要,但x射线图像的自动分析仍然是一个复杂的问题,因为图像有噪声,对比度低,还有一些伪影。人工神经网络是一种可以训练的系统,它可以根据提供的条件分析输入数据,从而得出所需的输出。这使得系统自动减少了对数据分析的主观干扰。因此,基于人工神经网络的系统是解决这一问题的可行方案。由于输入图像的复杂性和噪声的存在,噪声的去除成为x射线图像中的一个问题。基于统计分析的预处理技术在图像降噪方面有很大的改善。对偏离一般结构模式和灰度分布的像素/像素组进行定位。利用统计处理后的像素值分别从缺陷区域和非缺陷区域获得特征向量。开发了用于无损检测图像预处理和分析的软件。软件允许用户训练神经网络进行缺陷检测。一旦训练满意,软件扫描新的输入图像,并使用训练好的人工神经网络进行缺陷检测。将显示带有缺陷区域标记的最终图像。该系统可用于获取给定输入图像中可能存在缺陷的区域。本文介绍了MLP和RBF在缺陷检测中的性能。讨论了不同输入类型即模板和矩对人工神经网络性能的影响。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Comparison of different ANN techniques for automatic defect detection in X-Ray images
X-ray imaging is extensively used in the NDT. In the conventional method, interpretation of the large number of radiographs for defect detection and evaluation is carried out manually by operator or expert, which makes the system subjective. Also interpretation of large number of images is tedious and may lead to misinterpretation. Automation of Non-Destructive evaluation techniques is gaining greater relevance but automatic analysis of X-Ray images is still a complex problem, as the images are noisy, low contrast with a number of artifacts. ANN's are systems which can be trained to analyze input data based on conditions provided to derive required output. This makes the system automatic reducing the subjective interference in analysis of data. Artificial neural network based systems are thus a feasible solution to this problem of X-Ray NDT. Due to complex nature of input images and noise present, Noise removal becomes a problem in X-Ray images. Preprocessing techniques based on statistical analysis have shown improvement in image noise reduction. Pixels/group of pixels, which deviate from the general structural pattern and grey scale distribution are located. The statistically processed pixel values are used to obtain the features vector from defective as well as from non-defective areas. Software for pre-processing and analyzing NDT images has been developed. Software allows user to train neural networks for defect detection. Once trained satisfactorily, the software scans the new input image and uses the trained ANN for defect detection. The final image with defect regions marked will be displayed. This system can be used to obtain the probable defective areas in a given input image. This paper presents performance of MLP and RBF for detection of defect. The effect of different types of input viz. template and moments on performance of ANN is discussed.
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