先进SMT封装用激光辅助键合无源SMD元件的三维叠加研究

Matthias Fettke, Timo Kubsch, Alexander Frick, Vinith Bejugam, Georg Friedrich, T. Teutsch
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引用次数: 0

摘要

本研究演示了SMD钽Elko和MLCC(多层陶瓷片电容器)电容器的激光辅助键合(LAB),并与传统的锡膏和回流炉键合进行了比较。Pac Tech独有的LAB技术大大改善了传统烤箱回流工艺中包装的后续性能。由于LAB工艺是温度控制的,因此可以对键合层(焊料)进行非破坏性、快速和微创的回流。虽然LAB工艺之前在广泛的应用方面得到了证明,但其在电容器或电阻等无源SMD元件的堆叠方面的可行性和优势尚未得到评估[1]-[3]和[4]。本研究将评估SMD电容器的3D堆叠可能性。这种技术允许垂直或水平排列的SMD元件在彼此的顶部。给定器件(如电容器)的总体占用空间可以减少,因为它可以被两个或更多较小器件的堆栈所取代。为了评估LAB工艺的潜力,几种尺寸的SMD电容器(3216M, 2012M和1005M)进行了粘合和堆叠。对给定数量的样品进行了参数化研究,以评估合适的处理窗口。为了分析测试组件,采用了多种技术,如显微检查、电气鉴定、3D表面扫描、剪切测试和截面分析。通过振动试验对组件的鲁棒性进行了研究。具体而言,通过几次高频振动试验,模拟了器件相对于三维载荷的力学性能。最后,对无源SMD元件堆叠和LAB SMD组装的潜在应用前景进行了展望。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
A study about 3D stacking of passive SMD elements for advanced SMT packaging using laser assisted bonding
This study demonstrates laser assisted bonding (LAB) of SMD Tantal Elko and MLCC (Multilayer Ceramic Chip Capacitor) capacitors and presents a comparison to conventional bonding using solder paste and reflow oven. The LAB technique, unique to Pac Tech, has greatly improved ensuing properties of packages over conventional oven reflow processes. As the LAB process is temperature controlled, it allows for a non-destructive yet fast and minimally invasive reflow of the bond-layer (solder). While the LAB process was demonstrated previously in terms of a wide range of applications, its feasibility and advantages have not yet been assessed for the stacking of passive SMD elements such as capacitors or resistors [1]–[3] and [4]. In this study, the 3D stacking possibilities of SMD capacitors will be evaluated. This technique allows the vertical or horizontal arrangement of the SMD elements on top of each other. The overall footprint of a given device such as a capacitor can be reduced, as it can be replaced by a stack of two or more smaller devices. To evaluate the potential of the LAB process, several sizes of SMD capacitors (3216M, 2012M and 1005M) were bonded and stacked. A parametric study was performed to evaluate suitable process windows for a given number of samples. To analyze test assemblies, several techniques were employed such as microscopic inspection, electrical qualification, 3D surface scans, shear-test and cross-sectional analysis. The robustness of the assemblies was investigated via a vibration test. Specifically, the mechanical properties of the devices were simulated through several cycles of high frequency vibration tests relative to three-dimensional loads. Finally, future perspectives regarding potential applications of passive SMD element stacking and LAB SMD assembly are elucidated.
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