Mohammed Amellall, S. O. Land, R. Perdriau, M. Ramdani, A. Ahaitouf, M. Drissi
{"title":"对SPI EEPROM存储器的功能和非功能信号的直接功率注入","authors":"Mohammed Amellall, S. O. Land, R. Perdriau, M. Ramdani, A. Ahaitouf, M. Drissi","doi":"10.1109/EMCCOMPO.2015.7358324","DOIUrl":null,"url":null,"abstract":"This paper deals with the conducted immunity of SPI EEPROM memories. The design and implementation of a wideband radio frequency-baseband multiplexer are described. This multiplexer makes it possible to superimpose radio frequency noise to a functional baseband signal with controlled and repeatable transfer characteristics. The baseband path has a measured DC - 380MHz bandwidth, while the radio frequency path (up to 1W) has a 150kHz - 5GHz bandwidth. This multiplexer is used to compare the conducted immunity of functional and non-functional pins of EEPROM memories with a single measurement set-up.","PeriodicalId":236992,"journal":{"name":"2015 10th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo)","volume":"83 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2015-12-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"Direct power injection on functional and non-functional signals of SPI EEPROM memories\",\"authors\":\"Mohammed Amellall, S. O. Land, R. Perdriau, M. Ramdani, A. Ahaitouf, M. Drissi\",\"doi\":\"10.1109/EMCCOMPO.2015.7358324\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper deals with the conducted immunity of SPI EEPROM memories. The design and implementation of a wideband radio frequency-baseband multiplexer are described. This multiplexer makes it possible to superimpose radio frequency noise to a functional baseband signal with controlled and repeatable transfer characteristics. The baseband path has a measured DC - 380MHz bandwidth, while the radio frequency path (up to 1W) has a 150kHz - 5GHz bandwidth. This multiplexer is used to compare the conducted immunity of functional and non-functional pins of EEPROM memories with a single measurement set-up.\",\"PeriodicalId\":236992,\"journal\":{\"name\":\"2015 10th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo)\",\"volume\":\"83 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2015-12-17\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2015 10th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/EMCCOMPO.2015.7358324\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2015 10th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EMCCOMPO.2015.7358324","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Direct power injection on functional and non-functional signals of SPI EEPROM memories
This paper deals with the conducted immunity of SPI EEPROM memories. The design and implementation of a wideband radio frequency-baseband multiplexer are described. This multiplexer makes it possible to superimpose radio frequency noise to a functional baseband signal with controlled and repeatable transfer characteristics. The baseband path has a measured DC - 380MHz bandwidth, while the radio frequency path (up to 1W) has a 150kHz - 5GHz bandwidth. This multiplexer is used to compare the conducted immunity of functional and non-functional pins of EEPROM memories with a single measurement set-up.