{"title":"双波长反射率法无发射率热成像","authors":"Y. Yamaguchi, Yoshiro Yamada","doi":"10.1109/SICE.2015.7285446","DOIUrl":null,"url":null,"abstract":"Dual-wavelength reflectance-ratio (DWR) technique is extended to thermal imaging. Compared to the spot DWR, signals from two-dimensionally arrayed detectors need a lot of calculation processing, but the method makes it easy to understand actual temperature distribution and has widely applicable fields. In this presentation, principle of DWR, measurement setup and results are shown.","PeriodicalId":405766,"journal":{"name":"Annual Conference of the Society of Instrument and Control Engineers of Japan","volume":"347 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2015-07-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Emissivity-free thermal imaging with dual-wavelength reflectance-ratio method\",\"authors\":\"Y. Yamaguchi, Yoshiro Yamada\",\"doi\":\"10.1109/SICE.2015.7285446\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Dual-wavelength reflectance-ratio (DWR) technique is extended to thermal imaging. Compared to the spot DWR, signals from two-dimensionally arrayed detectors need a lot of calculation processing, but the method makes it easy to understand actual temperature distribution and has widely applicable fields. In this presentation, principle of DWR, measurement setup and results are shown.\",\"PeriodicalId\":405766,\"journal\":{\"name\":\"Annual Conference of the Society of Instrument and Control Engineers of Japan\",\"volume\":\"347 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2015-07-28\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Annual Conference of the Society of Instrument and Control Engineers of Japan\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/SICE.2015.7285446\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Annual Conference of the Society of Instrument and Control Engineers of Japan","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/SICE.2015.7285446","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Emissivity-free thermal imaging with dual-wavelength reflectance-ratio method
Dual-wavelength reflectance-ratio (DWR) technique is extended to thermal imaging. Compared to the spot DWR, signals from two-dimensionally arrayed detectors need a lot of calculation processing, but the method makes it easy to understand actual temperature distribution and has widely applicable fields. In this presentation, principle of DWR, measurement setup and results are shown.
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