{"title":"用于直接x射线转换的半导体传感器","authors":"K. Iniewski, T. Astill","doi":"10.1201/9781351250092-5","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":244199,"journal":{"name":"Sensors for Diagnostics and Monitoring","volume":"9 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2018-09-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Semiconductor Sensors for Direct X-Ray Conversion\",\"authors\":\"K. Iniewski, T. Astill\",\"doi\":\"10.1201/9781351250092-5\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"\",\"PeriodicalId\":244199,\"journal\":{\"name\":\"Sensors for Diagnostics and Monitoring\",\"volume\":\"9 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2018-09-03\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Sensors for Diagnostics and Monitoring\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1201/9781351250092-5\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Sensors for Diagnostics and Monitoring","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1201/9781351250092-5","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}