{"title":"如何确定手性材料参数","authors":"M. Oksanen, A. Hujanen","doi":"10.1109/EUMA.1992.335739","DOIUrl":null,"url":null,"abstract":"This paper discusses how material parameters of a chiral slab can be determined from the measured reflected and transmitted fields of the slab in free space. The method uses a so called K-notation in the constitutive relations of a chiral material. This allows one to derive analytical formulas for permittivity, permeability and chirality parameters of the measured material.","PeriodicalId":317106,"journal":{"name":"1992 22nd European Microwave Conference","volume":"18 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1992-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"12","resultStr":"{\"title\":\"How to Determine Chiral Material Parameters\",\"authors\":\"M. Oksanen, A. Hujanen\",\"doi\":\"10.1109/EUMA.1992.335739\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper discusses how material parameters of a chiral slab can be determined from the measured reflected and transmitted fields of the slab in free space. The method uses a so called K-notation in the constitutive relations of a chiral material. This allows one to derive analytical formulas for permittivity, permeability and chirality parameters of the measured material.\",\"PeriodicalId\":317106,\"journal\":{\"name\":\"1992 22nd European Microwave Conference\",\"volume\":\"18 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1992-10-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"12\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"1992 22nd European Microwave Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/EUMA.1992.335739\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"1992 22nd European Microwave Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EUMA.1992.335739","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
This paper discusses how material parameters of a chiral slab can be determined from the measured reflected and transmitted fields of the slab in free space. The method uses a so called K-notation in the constitutive relations of a chiral material. This allows one to derive analytical formulas for permittivity, permeability and chirality parameters of the measured material.
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