轴向硅单片生长的InAs/GaAs量子点激光器(001)

Manyu Dang, M. Tang, Junjie Yang, A. Seeds, Siming Chen, Huiyun Liu
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引用次数: 0

摘要

反转边界(IBs)是由极性III-V材料在非极性Si(001)衬底上生长而产生的带电平面缺陷。本文展示了一种在轴向Si(001)衬底上实现全mbe生长的无IB GaAs的新技术,该技术采用周期性的Si单原子高度步骤来重新分配IB的成核,并在随后的GaAs生长中促进IB的自湮灭。此外,电子泵浦量子点(QD)激光器已经在这个无ib的GaAs/Si平台上进行了演示,最高工作温度为120°C。这些结果可能是迈向III-V材料和器件与成熟CMOS技术的单片集成的重要一步。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
InAs/GaAs Quantum-Dot Lasers Monolithically Grown on on-axis Silicon (001)
Inversion boundaries (IBs) are charged planer defects that arise from the growth of polar III-V materials on non-polar Si (001) substrate. This paper demonstrates a novel technique to achieve all-MBE grown, IB-free GaAs on on-axis Si (001) substrates by employing periodic Si single-atomic-height steps to re-distribute the nucleation of IBs and promote IB self-annihilation in the subsequent GaAs growth. Furthermore, an electronically pumped quantum-dot (QD) laser has been demonstrated on this IB-free GaAs/Si platform with a maximum operating temperature of 120 °C. These results could be a significant step towards the monolithic integration of III-V materials and devices with mature CMOS technology.
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