电力电子用MEMS开关的性能限制

P. Steeneken, O. Wunnicke
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引用次数: 5

摘要

半导体技术的进步使功率晶体管的性能接近物理极限。因此,要想大幅提高电源开关的性能,要么需要新材料,要么需要遵守根本不同限制的新器件。一种可能替代晶体管的新型功率器件是微机电(MEMS)开关。在这里,我们通过探索金属接触MEMS开关的物理性能极限并将其与晶体管进行基准测试,分析了金属接触MEMS开关在电力电子领域的潜力。基于半经验模型,我们表明MEMS开关可以在Vact> 30v的驱动电压下优于Si晶体管,甚至可以在Vact> 1000v的驱动电压下优于GaN晶体管。因此,我们得出结论,MEMS开关技术可能为高性能功率器件提供了一个有趣的替代途径,尽管开关时间和安全操作区域仍然是值得关注的问题。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Performance limits of MEMS switches for power electronics
Advances in semiconductor technology have brought the performance of power transistors near the physical limit. Substantial performance enhancement of power switches will therefore require either new materials, or new devices that obey fundamentally different limits. One of the new power devices that might offer an alternative to the transistor is the microelectromechanical (MEMS) switch. Here we analyze the potential of metal-contact MEMS switches for power electronics by exploring their physical performance limits and by benchmarking them against transistors. Based on a semi-empirical model we show that MEMS switches could outperform Si transistors for actuation voltages Vact>;30 V and could even beat GaN for Vact>;1000 V. Therefore we conclude that MEMS switch technology potentially offers an interesting alternative route towards high performance power devices, although switching time and safe operating area remain points of concern.
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