L. Dubé-Riopel, B. Baloukas, O. Zabeida, L. Martinu
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In Situ and Ex Situ Spectroscopic Ellipsometry of Electrochromic NiO Films
In situ ellipsometric measurements during cyclic voltammetry, supported by ex situ measurements, allow for the precise and continuous characterization of the optical properties of electrochromic NiO films in their various states of coloration.
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