存储器BISR的产量增益-一个案例研究

2009 52nd IEEE International Midwest Symposium on Circuits and Systems Pub Date : 2009-09-15 DOI:10.1109/MWSCAS.2009.5235998

M. Karunaratne, B. Oomann

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引用次数: 16

摘要

我们对使用冗余数据列的嵌入式存储器应用了一种BIST软修复方案。我们从商业硅部件中获得了良率和缺陷数据，并探索了仅通过单位修复就可能提高良率的可能性。我们在一个有90个存储器的芯片上实现了它，并改变了进程余量以获得分割批次来验证修复方案。

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Yield gain with memory BISR — a case study

We applied a BIST soft repair scheme to embedded memories using redundant data columns. We obtained yield and defect data from commercial silicon parts, and explored possible yield improvements with only a single bit repair. We implemented it on a chip with 90 memories and process margins were changed to obtain split lots to validate the repair scheme.

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2009 52nd IEEE International Midwest Symposium on Circuits and Systems

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