红外离子注入GaAs光学

M. Mentzer, R. Hunsperger, J. Bartko, J. Zavada, H. Jenkinson
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引用次数: 0

摘要

离子注入自由载流子补偿是一种重要的红外光波导制备技术,具有广泛的应用前景。砷化镓是一种非常有吸引力的基底材料,用于光学制造,因为它是透明的远红外线。此外,砷化镓及其相关的三元和四季化合物具有将光学器件集成到传感和信号处理电路中所需的许多光学和电子特性。这将提供VLSI电子器件和GaAs光电子器件的最终合并,以及微波电子器件(如gunn二极管和肖特基门场效应管)与GaAs光学元件的单片集成。实验表征了不同H+注入参数对载流子补偿过程的影响,并将由此产生的光学效应与电子变化联系起来。所利用的设计技术适用于1至12微米的工作波长,并且可用于各种特定的器件应用。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Infrared ION Implanted GaAs Optics
Free carrier compensation by ion implantation is an important fabrication technology for the formation of infrared optical waveguides for a variety of applications. Gallium arsenide is a very attractive substrate material for optical fabrication since it is transparent out to the far infrared. In addition, GaAs, together with its related ternary and quarternary compounds, has many of the optical and electronic properties necessary for integration of optical devices into sensing and signal processing circuits. This will afford the ultimate merger of the VLSI electronics and GaAs optoelectronics, as well as the monolithic integration of microwave electronic devices such as gunn diodes and Schottky gate FET's, with GaAs optical components. Experiments were performed to characterize the influence of various H+ implantation parameters on the carrier compensation process and to relate the resulting optical effects to electronic changes. The design techniques utilized are applicable from 1 to 12 micron operating wavelengths and may be utilized in a variety of specific device applications.
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