多链完整性故障的共性分析

ISTFA 2021: Conference Proceedings from the 47th International Symposium for Testing and Failure Analysis Pub Date : 2021-10-31 DOI:10.31399/asm.cp.istfa2021p0334

A. Merassi, M. Medda

{"title":"多链完整性故障的共性分析","authors":"A. Merassi, M. Medda","doi":"10.31399/asm.cp.istfa2021p0334","DOIUrl":null,"url":null,"abstract":"\n The aim of this paper is to disclose an alternative FA approach to handle complex cases, showing multiple chain failures with multiple candidates. Starting from a commonality layout analysis of candidates resulting from the diagnosis, it is possible to identify a common interconnection shared between the several candidates, already at schematic level. The effectiveness of such analysis has been successfully verified by means of a photo-emission microscopy (PEM) analysis, while running scan chain patterns and by physical analysis.","PeriodicalId":188323,"journal":{"name":"ISTFA 2021: Conference Proceedings from the 47th International Symposium for Testing and Failure Analysis","volume":"136 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2021-10-31","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Commonality Analysis for Multiple Chain Integrity Failures\",\"authors\":\"A. Merassi, M. Medda\",\"doi\":\"10.31399/asm.cp.istfa2021p0334\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"\\n The aim of this paper is to disclose an alternative FA approach to handle complex cases, showing multiple chain failures with multiple candidates. Starting from a commonality layout analysis of candidates resulting from the diagnosis, it is possible to identify a common interconnection shared between the several candidates, already at schematic level. The effectiveness of such analysis has been successfully verified by means of a photo-emission microscopy (PEM) analysis, while running scan chain patterns and by physical analysis.\",\"PeriodicalId\":188323,\"journal\":{\"name\":\"ISTFA 2021: Conference Proceedings from the 47th International Symposium for Testing and Failure Analysis\",\"volume\":\"136 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2021-10-31\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"ISTFA 2021: Conference Proceedings from the 47th International Symposium for Testing and Failure Analysis\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.31399/asm.cp.istfa2021p0334\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"ISTFA 2021: Conference Proceedings from the 47th International Symposium for Testing and Failure Analysis","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.31399/asm.cp.istfa2021p0334","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

引用次数: 0

摘要

本文的目的是揭示一种替代的FA方法来处理复杂的情况，显示多个候选的多个链故障。从诊断产生的候选候选的共性布局分析开始，有可能确定几个候选候选之间共享的公共互连，已经在示意图级别。通过光发射显微镜(PEM)分析，同时运行扫描链模式和物理分析，成功验证了这种分析的有效性。

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Commonality Analysis for Multiple Chain Integrity Failures

The aim of this paper is to disclose an alternative FA approach to handle complex cases, showing multiple chain failures with multiple candidates. Starting from a commonality layout analysis of candidates resulting from the diagnosis, it is possible to identify a common interconnection shared between the several candidates, already at schematic level. The effectiveness of such analysis has been successfully verified by means of a photo-emission microscopy (PEM) analysis, while running scan chain patterns and by physical analysis.

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ISTFA 2021: Conference Proceedings from the 47th International Symposium for Testing and Failure Analysis

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