通过半导体制造设备的进步扩展摩尔定律

A. Sinha
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引用次数: 0

摘要

仅给出摘要形式,如下。经过三十多年的有效性,对电子工业的相关利益和几次假警报,摩尔定律似乎再次受到脱轨的威胁。这些威胁以三波汇聚的形式出现,需要对以下方面进行重大必要的改变:a)低于0.13 /spl mu/m的光刻,这涉及到使用未经验证的新型激光器/透镜系统在亚微米波长尺寸上进行印刷和对准;b) Cu/low-/spl kappa/互连技术,该技术在实现商业上可行的产量方面面临重大挑战;c) 300毫米晶圆尺寸转换,这需要对整个行业进行广泛的重组。随着电子行业进入后pc、互联网时代,这些有利的变化叠加在半导体晶圆厂日益激进的成本/质量要求上。作者回顾了半导体制造设备领域正在进行的一些前沿工作,包括多代现有安装基础的可扩展性/重用性,改进的BKM(最知名的方法)和集成过程模块。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Extending Moore's Law through advances in semiconductor manufacturing equipment
Summary form only given, as follows. After more than thirty years of effectiveness, associated benefits to the electronics industry and several false alarms, it appears that Moore's Law is again threatened with derailment. These threats are in the form of a convergence of three waves which requires major necessary changes relating to: a) lithography below 0.13 /spl mu/m, which involves printing and aligning at submicron wavelength dimensions with new unproven lasers/lens systems; b) Cu/low-/spl kappa/ interconnect technology, which is facing major challenges in achieving commercially viable yields; and c) 300 mm wafer size conversion, which requires an extensive retooling of the entire industry. These enabling changes are overlaid on increasingly aggressive cost/quality requirements on the semiconductor fabs as the electronics industry evolves into the post-PC, Internet era. The author reviews some of the cutting edge work being done in the semiconductor manufacturing equipment area, including extendability/reuse of existing installed base for multiple generations, improved BKM's (Best Known Methodologies) and integrated process modules.
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