一种定量证明并将屏蔽要求和设计余量与硬件要求联系起来的方法(航空电子)

C. Guenther
{"title":"一种定量证明并将屏蔽要求和设计余量与硬件要求联系起来的方法(航空电子)","authors":"C. Guenther","doi":"10.1109/DASC.1990.111326","DOIUrl":null,"url":null,"abstract":"A methodology was developed and utilized for justifying to management, in a quantifiable and understandable way, the need for shielding electronic parts and design margins. The approach related the probability of part failure due to radiation to an associated part reliability. The part reliability was then correlated to an overall subsystem reliability and assessed against the subsystems' requirements. The approach is applicable to any environment whose consequences are cumulative. Consequently, effects resulting from displacement damage can be treated in a similar manner. The results are of interest in connection with the consideration of total dose impacts on electronics in the analysis of a spacecraft's response to the radiation environments encountered on orbit. The proposed approach is applicable to any environment whose consequences are cumulative. Consequently, effects resulting from displacement damage can be treated in a similar manner.<<ETX>>","PeriodicalId":141205,"journal":{"name":"9th IEEE/AIAA/NASA Conference on Digital Avionics Systems","volume":"15 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1990-10-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"A method to quantitatively justify and relate shielding requirements and design margins to hardware requirements (avionics)\",\"authors\":\"C. Guenther\",\"doi\":\"10.1109/DASC.1990.111326\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A methodology was developed and utilized for justifying to management, in a quantifiable and understandable way, the need for shielding electronic parts and design margins. The approach related the probability of part failure due to radiation to an associated part reliability. The part reliability was then correlated to an overall subsystem reliability and assessed against the subsystems' requirements. The approach is applicable to any environment whose consequences are cumulative. Consequently, effects resulting from displacement damage can be treated in a similar manner. The results are of interest in connection with the consideration of total dose impacts on electronics in the analysis of a spacecraft's response to the radiation environments encountered on orbit. The proposed approach is applicable to any environment whose consequences are cumulative. Consequently, effects resulting from displacement damage can be treated in a similar manner.<<ETX>>\",\"PeriodicalId\":141205,\"journal\":{\"name\":\"9th IEEE/AIAA/NASA Conference on Digital Avionics Systems\",\"volume\":\"15 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1990-10-15\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"9th IEEE/AIAA/NASA Conference on Digital Avionics Systems\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/DASC.1990.111326\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"9th IEEE/AIAA/NASA Conference on Digital Avionics Systems","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/DASC.1990.111326","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1

摘要

开发并利用了一种方法,以可量化和可理解的方式向管理证明屏蔽电子部件和设计余量的必要性。该方法将零件因辐射而失效的概率与相关的零件可靠性联系起来。然后将部分可靠性与整个子系统可靠性相关联,并根据子系统的需求进行评估。该方法适用于其后果是累积的任何环境。因此,由位移损伤引起的影响可以用类似的方式处理。在分析航天器对轨道上遇到的辐射环境的反应时,考虑到对电子设备的总剂量影响,这些结果是有意义的。建议的方法适用于其后果是累积的任何环境。因此,由位移损伤引起的影响可以用类似的方式处理
本文章由计算机程序翻译,如有差异,请以英文原文为准。
A method to quantitatively justify and relate shielding requirements and design margins to hardware requirements (avionics)
A methodology was developed and utilized for justifying to management, in a quantifiable and understandable way, the need for shielding electronic parts and design margins. The approach related the probability of part failure due to radiation to an associated part reliability. The part reliability was then correlated to an overall subsystem reliability and assessed against the subsystems' requirements. The approach is applicable to any environment whose consequences are cumulative. Consequently, effects resulting from displacement damage can be treated in a similar manner. The results are of interest in connection with the consideration of total dose impacts on electronics in the analysis of a spacecraft's response to the radiation environments encountered on orbit. The proposed approach is applicable to any environment whose consequences are cumulative. Consequently, effects resulting from displacement damage can be treated in a similar manner.<>
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