{"title":"电子元件强制空气冷却的热尾流模型","authors":"A. Ortega, S. Ramanathan, J. D. Chicci, J. Prince","doi":"10.1109/STHERM.1993.225330","DOIUrl":null,"url":null,"abstract":"Analytical solutions are presented for the temperature field which arises from the application of a source of heat on an adiabatic plate or board when the fluid is represented as a uniform flow with an effective turbulent diffusivity, the so-called UFED flow model. Solutions are summarized for a point source, a one-dimensional strip source, and a rectangular source of heat. The ability to superpose the individual kernel solutions to obtain the temperature field due to multiple sources is demonstrated. The point source solution reveals that the N/sup -1/ law commonly observed for the centerline thermal wake decay for three-dimensional arrays is predicted by the point source solution for the UFED model. The thermal wake approaches the point source behavior downstream from the source, suggesting a new scaling for the far thermal wake that successfully collapses the thermal wake for several sizes of components and provides a fundamental basis for experimental observations previously made for arrays of three-dimensional components. Preliminary experimental results using a thermochromic liquid crystal thermal mapping technique are presented.<<ETX>>","PeriodicalId":369022,"journal":{"name":"[1993 Proceedings] Ninth Annual IEEE Semiconductor Thermal Measurement and Management Symposium","volume":"23 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1993-02-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"17","resultStr":"{\"title\":\"Thermal wake models for forced air cooling of electronic components\",\"authors\":\"A. Ortega, S. Ramanathan, J. D. Chicci, J. Prince\",\"doi\":\"10.1109/STHERM.1993.225330\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Analytical solutions are presented for the temperature field which arises from the application of a source of heat on an adiabatic plate or board when the fluid is represented as a uniform flow with an effective turbulent diffusivity, the so-called UFED flow model. Solutions are summarized for a point source, a one-dimensional strip source, and a rectangular source of heat. The ability to superpose the individual kernel solutions to obtain the temperature field due to multiple sources is demonstrated. The point source solution reveals that the N/sup -1/ law commonly observed for the centerline thermal wake decay for three-dimensional arrays is predicted by the point source solution for the UFED model. The thermal wake approaches the point source behavior downstream from the source, suggesting a new scaling for the far thermal wake that successfully collapses the thermal wake for several sizes of components and provides a fundamental basis for experimental observations previously made for arrays of three-dimensional components. Preliminary experimental results using a thermochromic liquid crystal thermal mapping technique are presented.<<ETX>>\",\"PeriodicalId\":369022,\"journal\":{\"name\":\"[1993 Proceedings] Ninth Annual IEEE Semiconductor Thermal Measurement and Management Symposium\",\"volume\":\"23 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1993-02-02\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"17\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"[1993 Proceedings] Ninth Annual IEEE Semiconductor Thermal Measurement and Management Symposium\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/STHERM.1993.225330\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"[1993 Proceedings] Ninth Annual IEEE Semiconductor Thermal Measurement and Management Symposium","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/STHERM.1993.225330","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Thermal wake models for forced air cooling of electronic components
Analytical solutions are presented for the temperature field which arises from the application of a source of heat on an adiabatic plate or board when the fluid is represented as a uniform flow with an effective turbulent diffusivity, the so-called UFED flow model. Solutions are summarized for a point source, a one-dimensional strip source, and a rectangular source of heat. The ability to superpose the individual kernel solutions to obtain the temperature field due to multiple sources is demonstrated. The point source solution reveals that the N/sup -1/ law commonly observed for the centerline thermal wake decay for three-dimensional arrays is predicted by the point source solution for the UFED model. The thermal wake approaches the point source behavior downstream from the source, suggesting a new scaling for the far thermal wake that successfully collapses the thermal wake for several sizes of components and provides a fundamental basis for experimental observations previously made for arrays of three-dimensional components. Preliminary experimental results using a thermochromic liquid crystal thermal mapping technique are presented.<>