J. Hwang, Jaehee Lee, Jong-Cheol Lee, D. Whang, S. Hwang
{"title":"从cvd生长层中简单剥离制备石墨烯场效应晶体管","authors":"J. Hwang, Jaehee Lee, Jong-Cheol Lee, D. Whang, S. Hwang","doi":"10.1109/NANO.2010.5697797","DOIUrl":null,"url":null,"abstract":"We develop a simple technique to fabricate graphene field-effect-transistor (FET) devices. Our technique is stripping graphene by scotch tape from the chemical vapor deposition (CVD)-grown layer, except the gap region between the source and drain electrode. The current-voltage (I–V) characteristic of a graphene FET before stripping shows a large zero-bias conductance of 6.5 mS and no gate operation. After stripping, the zero gate bias conductance of the device is reduced to 23 µS and a clear gate operation is observed. The change of FET characteristics before and after stripping is due to the formation of a urn size graphene flake. There is large potential that this one-step stripping technique can be extended to a more controllable method to fabricate graphene FET devices.","PeriodicalId":254587,"journal":{"name":"10th IEEE International Conference on Nanotechnology","volume":"2013 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2010-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"Fabrication of graphene field-effect transistors by simple stripping from CVD-grown layers\",\"authors\":\"J. Hwang, Jaehee Lee, Jong-Cheol Lee, D. Whang, S. Hwang\",\"doi\":\"10.1109/NANO.2010.5697797\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"We develop a simple technique to fabricate graphene field-effect-transistor (FET) devices. Our technique is stripping graphene by scotch tape from the chemical vapor deposition (CVD)-grown layer, except the gap region between the source and drain electrode. The current-voltage (I–V) characteristic of a graphene FET before stripping shows a large zero-bias conductance of 6.5 mS and no gate operation. After stripping, the zero gate bias conductance of the device is reduced to 23 µS and a clear gate operation is observed. The change of FET characteristics before and after stripping is due to the formation of a urn size graphene flake. There is large potential that this one-step stripping technique can be extended to a more controllable method to fabricate graphene FET devices.\",\"PeriodicalId\":254587,\"journal\":{\"name\":\"10th IEEE International Conference on Nanotechnology\",\"volume\":\"2013 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2010-08-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"10th IEEE International Conference on Nanotechnology\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/NANO.2010.5697797\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"10th IEEE International Conference on Nanotechnology","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/NANO.2010.5697797","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Fabrication of graphene field-effect transistors by simple stripping from CVD-grown layers
We develop a simple technique to fabricate graphene field-effect-transistor (FET) devices. Our technique is stripping graphene by scotch tape from the chemical vapor deposition (CVD)-grown layer, except the gap region between the source and drain electrode. The current-voltage (I–V) characteristic of a graphene FET before stripping shows a large zero-bias conductance of 6.5 mS and no gate operation. After stripping, the zero gate bias conductance of the device is reduced to 23 µS and a clear gate operation is observed. The change of FET characteristics before and after stripping is due to the formation of a urn size graphene flake. There is large potential that this one-step stripping technique can be extended to a more controllable method to fabricate graphene FET devices.